NASA/IPAC EXTRAGALACTIC DATABASE
Date and Time of the Query: 2019-06-18 T21:17:55 PDT
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Spectral Energy Distribution (SED) for 2MASX J15504152-0353175:

81 Data Points
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Photometric Data --- Published and Homogenized [Frequency, Flux Density] Units

  Published UnitsHomogenized Units [Frequency, Flux Density]  
No.Observed PassbandMeasurementUncertaintyUnitsFreq (Hz)MeasurementUncertaintyUnitsModeAperture/QualifiersReference CodeNo.
1 5-10 keV (XMM) 2.8E-13 ... erg cm^-2^ s^-1^ 1.81E+18 1.55E-08 ... Jy Broad-band 2005A&A...444..119G 1
2 2-10 keV (XMM) 0.37E-12 ... erg cm^-2^ s^-1^ 1.45E+18 2.55E-08 ... Jy Broad-band 2005A&A...444..119G 2
3 2-10 keV (XMM) 45E-14 ... erg/s/cm^2^ 1.45E+18 3.10E-08 ... Jy Broad-band 2011MNRAS.413.1206B 3
4 0.5-2 keV (XMM) 0.09E-12 ... erg cm^-2^ s^-1^ 3.02E+17 2.98E-08 ... Jy Broad-band 2005A&A...444..119G 4
5 J (2MASS/CTIO) 13.47 +/- 0.068 mag 2.43E+14 6.52E-03 +/- 4.09E-04 Jy Broad-band Profile-fit 2006AJ....131.1163S 5
6 J (2MASS/CTIO) 12.867 +/- 0.007 mag 2.43E+14 1.14E-02 +/- 7.33E-05 Jy Broad-band 4" aperture 2006AJ....131.1163S 6
7 J 11.953 +/- 0.047 mag 2.40E+14 2.63E-02 +/- 1.17E-03 Jy Broad-band 20032MASX.C.......: 7
8 J_14arcsec (2MASS) 12.552 +/- 0.015 mag 2.40E+14 1.52E-02 +/- 2.11E-04 Jy Broad-band 14.0 x 14.0 arcsec aperture. 20032MASX.C.......: 8
9 J 12.239 +/- 0.035 mag 2.40E+14 2.02E-02 +/- 6.63E-04 Jy Broad-band 30.6 x 25.7 arcsec integration area. 20032MASX.C.......: 9
10 H 11.461 +/- 0.072 mag 1.82E+14 2.67E-02 +/- 1.83E-03 Jy Broad-band 20032MASX.C.......: 10
11 H_14arcsec (2MASS) 11.798 +/- 0.018 mag 1.82E+14 1.95E-02 +/- 3.27E-04 Jy Broad-band 14.0 x 14.0 arcsec aperture. 20032MASX.C.......: 11
12 H 11.536 +/- 0.048 mag 1.82E+14 2.49E-02 +/- 1.12E-03 Jy Broad-band 30.6 x 25.7 arcsec integration area. 20032MASX.C.......: 12
13 H (2MASS/CTIO) 12.078 +/- 0.024 mag 1.80E+14 1.51E-02 +/- 3.34E-04 Jy Broad-band 4" aperture 2006AJ....131.1163S 13
14 H (2MASS/CTIO) 12.674 +/- 0.073 mag 1.80E+14 8.72E-03 +/- 5.87E-04 Jy Broad-band Profile-fit 2006AJ....131.1163S 14
15 K_s (2MASS/CTIO) 11.978 +/- 0.054 mag 1.39E+14 1.08E-02 +/- 5.36E-04 Jy Broad-band Profile-fit 2006AJ....131.1163S 15
16 K_s (2MASS/CTIO) 11.558 +/- 0.013 mag 1.39E+14 1.59E-02 +/- 1.90E-04 Jy Broad-band 4" aperture 2006AJ....131.1163S 16
17 K_s 11.020 +/- 0.058 mag 1.38E+14 2.61E-02 +/- 1.43E-03 Jy Broad-band 30.6 x 25.7 arcsec integration area. 20032MASX.C.......: 17
18 K_s 10.784 +/- 0.063 mag 1.38E+14 3.24E-02 +/- 1.94E-03 Jy Broad-band 20032MASX.C.......: 18
19 K_s_14arcsec (2MASS) 11.283 +/- 0.018 mag 1.38E+14 2.05E-02 +/- 3.42E-04 Jy Broad-band 14.0 x 14.0 arcsec aperture. 20032MASX.C.......: 19
20 3.6 microns (IRAC) 1.7119E+04 +/- 2.2774E+01 microJy 8.44E+13 1.71E-02 +/- 2.28E-05 Jy Broad-band 5.8" aperture 2013SSTSLC4.2....0C 20
21 3.6 microns (IRAC) 1.4577E+04 +/- 2.2940E+01 microJy 8.44E+13 1.46E-02 +/- 2.29E-05 Jy Broad-band 3.8" aperture 2013SSTSLC4.2....0C 21
22 3.6 microns (IRAC) 10.38 +/- 0.12 mag 8.44E+13 1.98E-02 +/- 2.19E-03 Jy Broad-band 2010ApJS..187..172G 22
23 4.5 microns (IRAC) 9.66 +/- 0.12 mag 6.67E+13 2.46E-02 +/- 2.72E-03 Jy Broad-band 2010ApJS..187..172G 23
24 5.5 microns (IRS) 4.29E-02 +/- 9.36E-03 Jy 5.45E+13 4.29E-02 +/- 9.36E-03 Jy Broad-band 2009ApJ...705...14D 24
25 5.8 microns (IRAC) 3.5922E+04 +/- 2.9176E+01 microJy 5.23E+13 3.59E-02 +/- 2.92E-05 Jy Broad-band 5.8" aperture 2013SSTSLC4.2....0C 25
26 5.8 microns (IRAC) 3.3415E+04 +/- 1.9326E+01 microJy 5.23E+13 3.34E-02 +/- 1.93E-05 Jy Broad-band 3.8" aperture 2013SSTSLC4.2....0C 26
27 5.8 microns (IRAC) 8.75 +/- 0.10 mag 5.23E+13 3.64E-02 +/- 3.35E-03 Jy Broad-band 2010ApJS..187..172G 27
28 6 microns (Spitzer) 2.95E-19 +/- 0.28E-19 W/cm^2^/microns 5.00E+13 3.54E-02 +/- 3.36E-03 Jy Broad-band 2007ApJ...671..124D 28
29 PAH 6.2 (Spitzer) ... <5.29E-20 W/cm^2^ 4.84E+13 < 5.29E+07 Jy-Hz Line 2009ApJ...701..658W 29
30 6.2 microns (IRS) ... <37E-17 W/m^2^ 4.84E+13 < 3.70E+10 Jy-Hz Line 2010ApJS..187..172G 30
31 [Ar II] (Spitzer) 0.08E-19 +/- 0.01E-19 W/cm^2^ 4.29E+13 8.00E+09 +/- 1.00E+09 Jy-Hz Line 2007ApJ...671..124D 31
32 7.4 microns (IRS) ... <202E-17 W/m^2^ 4.05E+13 < 2.02E+11 Jy-Hz Line 2010ApJS..187..172G 32
33 7.6 microns (IRS) ... <67E-17 W/m^2^ 3.94E+13 < 6.70E+10 Jy-Hz Line 2010ApJS..187..172G 33
34 7.8 microns (IRS) 75E-17 +/- 14E-17 W/m^2^ 3.84E+13 7.50E+10 +/- 1.40E+10 Jy-Hz Line 2010ApJS..187..172G 34
35 8.0 microns (IRAC) 7.03 +/- 0.07 mag 3.81E+13 9.89E-02 +/- 6.37E-03 Jy Broad-band 2010ApJS..187..172G 35
36 8.3 microns (IRS) ... <21E-17 W/m^2^ 3.61E+13 < 2.10E+10 Jy-Hz Line 2010ApJS..187..172G 36
37 8.6 microns (IRS) ... <17E-17 W/m^2^ 3.49E+13 < 1.70E+10 Jy-Hz Line 2010ApJS..187..172G 37
38 10 microns (IRS) 1.53E-01 +/- 2.09E-02 Jy 3.00E+13 1.53E-01 +/- 2.09E-02 Jy Broad-band 2009ApJ...705...14D 38
39 [S IV] (Spitzer) 0.07E-19 +/- 0.01E-19 W/cm^2^ 2.85E+13 7.00E+09 +/- 1.00E+09 Jy-Hz Line 2007ApJ...671..124D 39
40 [S IV] 10.51 (IRS) 5.19E-14 +/- 0.34E-14 erg/s/cm^2^ 2.85E+13 5.19E+09 +/- 3.40E+08 Jy-Hz Line SH module 2010ApJ...709.1257T 40
41 10.8 microns MIRLIN 102 +/- 10 milliJy 2.78E+13 1.02E-01 +/- 1.00E-02 Jy Broad-band 1.5" diam aperture 2004ApJ...605..156G 41
42 PAH 11.2 (Spitzer) 2.45E-20 +/- 0.48E-20 W/cm^2^ 2.68E+13 2.45E+07 +/- 4.80E+06 Jy-Hz Line 2009ApJ...701..658W 42
43 11.2 microns (IRS) 22E-17 +/- 3E-17 W/m^2^ 2.68E+13 2.20E+10 +/- 3.00E+09 Jy-Hz Line 2010ApJS..187..172G 43
44 11.3 microns (IRS) 47E-17 +/- 6E-17 W/m^2^ 2.65E+13 4.70E+10 +/- 6.00E+09 Jy-Hz Line 2010ApJS..187..172G 44
45 12.0 microns (IRS) 38E-17 +/- 5E-17 W/m^2^ 2.50E+13 3.80E+10 +/- 5.00E+09 Jy-Hz Line 2010ApJS..187..172G 45
46 12 microns (IRAS) 1.849E-01 +/- 15 % Jy 2.50E+13 1.85E-01 +/- 2.77E-02 Jy Broad-band IRAS quality flag = 3 1990IRASF.C...0000M 46
47 12.6 microns (IRS) 30E-17 +/- 6E-17 W/m^2^ 2.38E+13 3.00E+10 +/- 6.00E+09 Jy-Hz Line 2010ApJS..187..172G 47
48 [Ne II] 12.81 (IRS) 5.57E-14 +/- 0.28E-14 erg/s/cm^2^ 2.34E+13 5.57E+09 +/- 2.80E+08 Jy-Hz Line SH module 2010ApJ...709.1257T 48
49 [Ne II] 12.81 5.57E-21 ... W/cm^2^ 2.34E+13 5.57E+09 ... Jy-Hz Line 2011ApJS..195...17W 49
50 [Ne II] (Spitzer) 0.07E-19 +/- 0.01E-19 W/cm^2^ 2.34E+13 7.00E+09 +/- 1.00E+09 Jy-Hz Line 2007ApJ...671..124D 50
51 [Ne V] 14.32 (IRS) 6.08E-14 +/- 0.26E-14 erg/s/cm^2^ 2.09E+13 6.08E+09 +/- 2.60E+08 Jy-Hz Line SH module 2010ApJ...709.1257T 51
52 [Ne V] 14.32 6.08E-21 ... W/cm^2^ 2.09E+13 6.08E+09 ... Jy-Hz Line 2011ApJS..195...17W 52
53 [Ne V] 14.32 Spitzer 0.10E-19 +/- 0.01E-19 W/cm^2^ 2.09E+13 1.00E+10 +/- 1.00E+09 Jy-Hz Line 2007ApJ...671..124D 53
54 14.7 microns (IRS) 2.99E-01 +/- 1.86E-02 Jy 2.04E+13 2.99E-01 +/- 1.86E-02 Jy Broad-band 2009ApJ...705...14D 54
55 15 microns (Spitzer) 3.40E-19 +/- 0.09E-19 W/cm^2^/microns 2.00E+13 2.55E-01 +/- 6.75E-03 Jy Broad-band 2007ApJ...671..124D 55
56 [Ne III] 15.56 (IRS) 9.35E-14 +/- 0.32E-14 erg/s/cm^2^ 1.93E+13 9.35E+09 +/- 3.20E+08 Jy-Hz Line SH module 2010ApJ...709.1257T 56
57 [Ne III] 15.56 9.35E-21 ... W/cm^2^ 1.93E+13 9.35E+09 ... Jy-Hz Line 2011ApJS..195...17W 57
58 [Ne III] (Spitzer) 0.15E-19 +/- 0.01E-19 W/cm^2^ 1.93E+13 1.50E+10 +/- 1.00E+09 Jy-Hz Line 2007ApJ...671..124D 58
59 17.0 microns (IRS) ... <39E-17 W/m^2^ 1.76E+13 < 3.90E+10 Jy-Hz Line 2010ApJS..187..172G 59
60 [S III] 18.71 (IRS) 2.72E-14 +/- 0.48E-14 erg/s/cm^2^ 1.60E+13 2.72E+09 +/- 4.80E+08 Jy-Hz Line SH module 2010ApJ...709.1257T 60
61 [S III] 18.71 (IRS) ... <1.63E-14 erg/s/cm^2^ 1.60E+13 < 1.63E+09 Jy-Hz Line LH module 2010ApJ...709.1257T 61
62 [S III] 18.7 Spitzer 0.09E-19 +/- 0.01E-19 W/cm^2^ 1.60E+13 9.00E+09 +/- 1.00E+09 Jy-Hz Line 2007ApJ...671..124D 62
63 20 microns (Spitzer) 3.48E-19 +/- 0.08E-19 W/cm^2^/microns 1.50E+13 4.64E-01 +/- 1.07E-02 Jy Broad-band 2007ApJ...671..124D 63
64 20 microns (IRS) 4.22E-01 +/- 5.74E-03 Jy 1.50E+13 4.22E-01 +/- 5.74E-03 Jy Broad-band 2009ApJ...705...14D 64
65 24 microns (MIPS) 5.6796E+05 +/- 3.3410E+02 microJy 1.27E+13 5.68E-01 +/- 3.34E-04 Jy Broad-band PSF fit 2013SSTSLC4.2....0C 65
66 24 microns (MIPS) 5.5639E+05 +/- 1.9218E+02 microJy 1.27E+13 5.56E-01 +/- 1.92E-04 Jy Broad-band 14.7" aperture 2013SSTSLC4.2....0C 66
67 [Ne V] 24.32 Spitzer 0.09E-19 +/- 0.01E-19 W/cm^2^ 1.23E+13 9.00E+09 +/- 1.00E+09 Jy-Hz Line 2007ApJ...671..124D 67
68 [Ne V] 24.32 (IRS) 8.90E-14 +/- 0.22E-14 erg/s/cm^2^ 1.23E+13 8.90E+09 +/- 2.20E+08 Jy-Hz Line LH module 2010ApJ...709.1257T 68
69 25 microns (IRAS) 7.287E-01 +/- 8 % Jy 1.20E+13 7.29E-01 +/- 1.48E-02 Jy Broad-band IRAS quality flag = 3 1990IRASF.C...0000M 69
70 [O IV] 25.89 (IRS) 35.0E-14 +/- 0.29E-14 erg/s/cm^2^ 1.16E+13 3.50E+10 +/- 2.90E+08 Jy-Hz Line LH module 2010ApJ...709.1257T 70
71 [O IV] 25.89 35.0E-21 ... W/cm^2^ 1.16E+13 3.50E+10 ... Jy-Hz Line 2011ApJS..195...17W 71
72 [O IV] (Spitzer) 0.34E-19 +/- 0.01E-19 W/cm^2^ 1.16E+13 3.40E+10 +/- 1.00E+09 Jy-Hz Line 2007ApJ...671..124D 72
73 30 microns (IRS) 4.92E-01 +/- 8.65E-03 Jy 9.99E+12 4.92E-01 +/- 8.65E-03 Jy Broad-band 2009ApJ...705...14D 73
74 30 microns (Spitzer) 2.23E-19 +/- 0.04E-19 W/cm^2^/microns 9.99E+12 6.69E-01 +/- 1.20E-02 Jy Broad-band 2007ApJ...671..124D 74
75 [S III] 33.48 5.20E-21 ... W/cm^2^ 8.95E+12 5.20E+09 ... Jy-Hz Line 2011ApJS..195...17W 75
76 [S III] 33.48 (IRS) 5.20E-14 +/- 0.82E-14 erg/s/cm^2^ 8.95E+12 5.20E+09 +/- 8.20E+08 Jy-Hz Line LH module 2010ApJ...709.1257T 76
77 [Si II] 34.28 5.13E-21 ... W/cm^2^ 8.75E+12 5.13E+09 ... Jy-Hz Line 2011ApJS..195...17W 77
78 [Si II] 34.82 (IRS) 5.13E-14 +/- 0.82E-14 erg/s/cm^2^ 8.61E+12 5.13E+09 +/- 8.20E+08 Jy-Hz Line LH module 2010ApJ...709.1257T 78
79 60 microns (IRAS) 1.072E+00 +/- 8 % Jy 5.00E+12 1.07E+00 +/- 8.58E-02 Jy Broad-band IRAS quality flag = 2 1990IRASF.C...0000M 79
80 100 microns (IRAS) ... <4.054E+00 Jy 3.00E+12 < 4.05E+00 Jy Broad-band 1990IRASF.C...0000M 80
81 1.4GHz 42.2 +/- 1.4 milliJy 1.40E+09 4.22E-02 +/- 1.40E-03 Jy Broad-band 1998AJ....115.1693C 81


Detailed Information for Each Entry

 No. 1
Reference Code : 2005A&A...444..119G
Freq. targeted : 5-10 keV (XMM)      
Measurement    :  2.8E-13     erg cm^-2^ s^-1^     = 2.80E-16 W m^-2^
Uncertainty    :              erg cm^-2^ s^-1^     = 0.00E+00
Significance   : no uncertainty reported
Freq or Vel.   :      7.5     keV          (OBS   )= 1.81E+18 Hz
Frequency mode : Broad-band measurement
Coord. targeted:
Spatial mode   : Flux integrated from map
Notes          : From new raw data; NED frequency assigned to mid-point of
                 band in keV
Qualifiers     :                                         

No. 2 Reference Code : 2005A&A...444..119G Freq. targeted : 2-10 keV (XMM) Measurement : 0.37E-12 erg cm^-2^ s^-1^ = 3.70E-16 W m^-2^ Uncertainty : erg cm^-2^ s^-1^ = 0.00E+00 Significance : no uncertainty reported Freq or Vel. : 6 keV (OBS )= 1.45E+18 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data; NED frequency assigned to mid-point of band in keV Qualifiers :
No. 3 Reference Code : 2011MNRAS.413.1206B Freq. targeted : 2-10 keV (XMM) Measurement : 45E-14 erg/s/cm^2^ = 4.50E-16 W m^-2^ Uncertainty : erg/s/cm^2^ = 0.00E+00 Significance : no uncertainty reported Freq or Vel. : 6.00 keV (OBS )= 1.45E+18 Hz Frequency mode : Broad-band measurement Coord. targeted: 237.671 -03.889 (J2000) Spatial mode : Modelled datum Notes : From reprocessed raw data; NED frequency assigned to mid-point of band in keV Qualifiers :
No. 4 Reference Code : 2005A&A...444..119G Freq. targeted : 0.5-2 keV (XMM) Measurement : 0.09E-12 erg cm^-2^ s^-1^ = 9.00E-17 W m^-2^ Uncertainty : erg cm^-2^ s^-1^ = 0.00E+00 Significance : no uncertainty reported Freq or Vel. : 1.25 keV (OBS )= 3.02E+17 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data; NED frequency assigned to mid-point of band in keV Qualifiers :
No. 5 Reference Code : 2006AJ....131.1163S Freq. targeted : J (2MASS/CTIO) Measurement : 13.47 mag = 6.52E-29 W m^-2^ Hz^-1^ Uncertainty : 0.068 mag = 4.09E-30 Significance : uncertainty Freq or Vel. : 1.235 microns (OBS )= 2.43E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : Profile-fit
No. 6 Reference Code : 2006AJ....131.1163S Freq. targeted : J (2MASS/CTIO) Measurement : 12.867 mag = 1.14E-28 W m^-2^ Hz^-1^ Uncertainty : 0.007 mag = 7.33E-31 Significance : uncertainty Freq or Vel. : 1.235 microns (OBS )= 2.43E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 4" aperture
No. 7 Reference Code : 20032MASX.C.......: Freq. targeted : J Measurement : 11.953 mag = 2.63E-28 W m^-2^ Hz^-1^ Uncertainty : 0.047 mag = 1.17E-29 Significance : 1 sigma uncert. Freq or Vel. : 1.25 microns (OBS )= 2.40E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 155041.51 -035317.9 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers :
No. 8 Reference Code : 20032MASX.C.......: Freq. targeted : J_14arcsec (2MASS) Measurement : 12.552 mag = 1.52E-28 W m^-2^ Hz^-1^ Uncertainty : 0.015 mag = 2.11E-30 Significance : 1 sigma uncert. Freq or Vel. : 1.25 microns (OBS )= 2.40E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 155041.51 -035317.9 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 14.0 x 14.0 arcsec aperture.
No. 9 Reference Code : 20032MASX.C.......: Freq. targeted : J Measurement : 12.239 mag = 2.02E-28 W m^-2^ Hz^-1^ Uncertainty : 0.035 mag = 6.63E-30 Significance : 1 sigma uncert. Freq or Vel. : 1.25 microns (OBS )= 2.40E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 155041.51 -035317.9 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data; Corrected for contaminating sources Qualifiers : 30.6 x 25.7 arcsec integration area.
No. 10 Reference Code : 20032MASX.C.......: Freq. targeted : H Measurement : 11.461 mag = 2.67E-28 W m^-2^ Hz^-1^ Uncertainty : 0.072 mag = 1.83E-29 Significance : 1 sigma uncert. Freq or Vel. : 1.65 microns (OBS )= 1.82E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 155041.51 -035317.9 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers :
No. 11 Reference Code : 20032MASX.C.......: Freq. targeted : H_14arcsec (2MASS) Measurement : 11.798 mag = 1.95E-28 W m^-2^ Hz^-1^ Uncertainty : 0.018 mag = 3.27E-30 Significance : 1 sigma uncert. Freq or Vel. : 1.65 microns (OBS )= 1.82E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 155041.51 -035317.9 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 14.0 x 14.0 arcsec aperture.
No. 12 Reference Code : 20032MASX.C.......: Freq. targeted : H Measurement : 11.536 mag = 2.49E-28 W m^-2^ Hz^-1^ Uncertainty : 0.048 mag = 1.12E-29 Significance : 1 sigma uncert. Freq or Vel. : 1.65 microns (OBS )= 1.82E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 155041.51 -035317.9 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data; Corrected for contaminating sources Qualifiers : 30.6 x 25.7 arcsec integration area.
No. 13 Reference Code : 2006AJ....131.1163S Freq. targeted : H (2MASS/CTIO) Measurement : 12.078 mag = 1.51E-28 W m^-2^ Hz^-1^ Uncertainty : 0.024 mag = 3.34E-30 Significance : uncertainty Freq or Vel. : 1.662 microns (OBS )= 1.80E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 4" aperture
No. 14 Reference Code : 2006AJ....131.1163S Freq. targeted : H (2MASS/CTIO) Measurement : 12.674 mag = 8.72E-29 W m^-2^ Hz^-1^ Uncertainty : 0.073 mag = 5.87E-30 Significance : uncertainty Freq or Vel. : 1.662 microns (OBS )= 1.80E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : Profile-fit
No. 15 Reference Code : 2006AJ....131.1163S Freq. targeted : K_s (2MASS/CTIO) Measurement : 11.978 mag = 1.08E-28 W m^-2^ Hz^-1^ Uncertainty : 0.054 mag = 5.36E-30 Significance : uncertainty Freq or Vel. : 2.159 microns (OBS )= 1.39E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : Profile-fit
No. 16 Reference Code : 2006AJ....131.1163S Freq. targeted : K_s (2MASS/CTIO) Measurement : 11.558 mag = 1.59E-28 W m^-2^ Hz^-1^ Uncertainty : 0.013 mag = 1.90E-30 Significance : uncertainty Freq or Vel. : 2.159 microns (OBS )= 1.39E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 4" aperture
No. 17 Reference Code : 20032MASX.C.......: Freq. targeted : K_s Measurement : 11.020 mag = 2.61E-28 W m^-2^ Hz^-1^ Uncertainty : 0.058 mag = 1.43E-29 Significance : 1 sigma uncert. Freq or Vel. : 2.17 microns (OBS )= 1.38E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 155041.51 -035317.9 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data; Corrected for contaminating sources Qualifiers : 30.6 x 25.7 arcsec integration area.
No. 18 Reference Code : 20032MASX.C.......: Freq. targeted : K_s Measurement : 10.784 mag = 3.24E-28 W m^-2^ Hz^-1^ Uncertainty : 0.063 mag = 1.94E-29 Significance : 1 sigma uncert. Freq or Vel. : 2.17 microns (OBS )= 1.38E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 155041.51 -035317.9 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers :
No. 19 Reference Code : 20032MASX.C.......: Freq. targeted : K_s_14arcsec (2MASS) Measurement : 11.283 mag = 2.05E-28 W m^-2^ Hz^-1^ Uncertainty : 0.018 mag = 3.42E-30 Significance : 1 sigma uncert. Freq or Vel. : 2.17 microns (OBS )= 1.38E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 155041.51 -035317.9 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 14.0 x 14.0 arcsec aperture.
No. 20 Reference Code : 2013SSTSLC4.2....0C Freq. targeted : 3.6 microns (IRAC) Measurement : 1.7119E+04 microJy = 1.71E-28 W m^-2^ Hz^-1^ Uncertainty : 2.2774E+01 microJy = 2.28E-31 Significance : uncertainty Freq or Vel. : 3.55 microns (OBS )= 8.44E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 5.8" aperture
No. 21 Reference Code : 2013SSTSLC4.2....0C Freq. targeted : 3.6 microns (IRAC) Measurement : 1.4577E+04 microJy = 1.46E-28 W m^-2^ Hz^-1^ Uncertainty : 2.2940E+01 microJy = 2.29E-31 Significance : uncertainty Freq or Vel. : 3.55 microns (OBS )= 8.44E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 3.8" aperture
No. 22 Reference Code : 2010ApJS..187..172G Freq. targeted : 3.6 microns (IRAC) Measurement : 10.38 mag = 1.98E-28 W m^-2^ Hz^-1^ Uncertainty : 0.12 mag = 2.19E-29 Significance : uncertainty Freq or Vel. : 3.550 microns (OBS )= 8.44E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: 15 50 41.48 -03 53 18.1 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers :
No. 23 Reference Code : 2010ApJS..187..172G Freq. targeted : 4.5 microns (IRAC) Measurement : 9.66 mag = 2.46E-28 W m^-2^ Hz^-1^ Uncertainty : 0.12 mag = 2.72E-29 Significance : uncertainty Freq or Vel. : 4.493 microns (OBS )= 6.67E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: 15 50 41.48 -03 53 18.1 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers :
No. 24 Reference Code : 2009ApJ...705...14D Freq. targeted : 5.5 microns (IRS) Measurement : 4.29E-02 Jy = 4.29E-28 W m^-2^ Hz^-1^ Uncertainty : 9.36E-03 Jy = 9.36E-29 Significance : uncertainty Freq or Vel. : 5.5 microns (OBS )= 5.45E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From reprocessed raw data Qualifiers :
No. 25 Reference Code : 2013SSTSLC4.2....0C Freq. targeted : 5.8 microns (IRAC) Measurement : 3.5922E+04 microJy = 3.59E-28 W m^-2^ Hz^-1^ Uncertainty : 2.9176E+01 microJy = 2.92E-31 Significance : uncertainty Freq or Vel. : 5.731 microns (OBS )= 5.23E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 5.8" aperture
No. 26 Reference Code : 2013SSTSLC4.2....0C Freq. targeted : 5.8 microns (IRAC) Measurement : 3.3415E+04 microJy = 3.34E-28 W m^-2^ Hz^-1^ Uncertainty : 1.9326E+01 microJy = 1.93E-31 Significance : uncertainty Freq or Vel. : 5.731 microns (OBS )= 5.23E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 3.8" aperture
No. 27 Reference Code : 2010ApJS..187..172G Freq. targeted : 5.8 microns (IRAC) Measurement : 8.75 mag = 3.64E-28 W m^-2^ Hz^-1^ Uncertainty : 0.10 mag = 3.35E-29 Significance : uncertainty Freq or Vel. : 5.731 microns (OBS )= 5.23E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: 15 50 41.48 -03 53 18.1 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers :
No. 28 Reference Code : 2007ApJ...671..124D Freq. targeted : 6 microns (Spitzer) Measurement : 2.95E-19 W/cm^2^/microns = 3.54E-28 W m^-2^ Hz^-1^ Uncertainty : 0.28E-19 W/cm^2^/microns = 3.36E-29 Significance : uncertainty Freq or Vel. : 6.00 microns (OBS )= 5.00E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 29 Reference Code : 2009ApJ...701..658W Freq. targeted : PAH 6.2 (Spitzer) Measurement : <5.29E-20 W/cm^2^ < 5.29E-19 W m^-2^ Uncertainty : Significance : no uncertainty reported Freq or Vel. : 6.2 microns (REST )= 4.84E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 15 50 41.5 -03 53 18 (J2000) Spatial mode : Flux in fixed aperture Notes : From reprocessed raw data Qualifiers :
No. 30 Reference Code : 2010ApJS..187..172G Freq. targeted : 6.2 microns (IRS) Measurement : <37E-17 W/m^2^ < 3.70E-16 W m^-2^ Uncertainty : Significance : 3 sigma Freq or Vel. : 6.2 microns (REST )= 4.84E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 15 50 41.48 -03 53 18.1 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 31 Reference Code : 2007ApJ...671..124D Freq. targeted : [Ar II] (Spitzer) Measurement : 0.08E-19 W/cm^2^ = 8.00E-17 W m^-2^ Uncertainty : 0.01E-19 W/cm^2^ = 1.00E-17 Significance : uncertainty Freq or Vel. : 6.99 microns (REST )= 4.29E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 32 Reference Code : 2010ApJS..187..172G Freq. targeted : 7.4 microns (IRS) Measurement : <202E-17 W/m^2^ < 2.02E-15 W m^-2^ Uncertainty : Significance : 3 sigma Freq or Vel. : 7.4 microns (REST )= 4.05E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 15 50 41.48 -03 53 18.1 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 33 Reference Code : 2010ApJS..187..172G Freq. targeted : 7.6 microns (IRS) Measurement : <67E-17 W/m^2^ < 6.70E-16 W m^-2^ Uncertainty : Significance : 3 sigma Freq or Vel. : 7.6 microns (REST )= 3.94E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 15 50 41.48 -03 53 18.1 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 34 Reference Code : 2010ApJS..187..172G Freq. targeted : 7.8 microns (IRS) Measurement : 75E-17 W/m^2^ = 7.50E-16 W m^-2^ Uncertainty : 14E-17 W/m^2^ = 1.40E-16 Significance : 1 sigma Freq or Vel. : 7.8 microns (REST )= 3.84E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 15 50 41.48 -03 53 18.1 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 35 Reference Code : 2010ApJS..187..172G Freq. targeted : 8.0 microns (IRAC) Measurement : 7.03 mag = 9.89E-28 W m^-2^ Hz^-1^ Uncertainty : 0.07 mag = 6.37E-29 Significance : uncertainty Freq or Vel. : 7.872 microns (OBS )= 3.81E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: 15 50 41.48 -03 53 18.1 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers :
No. 36 Reference Code : 2010ApJS..187..172G Freq. targeted : 8.3 microns (IRS) Measurement : <21E-17 W/m^2^ < 2.10E-16 W m^-2^ Uncertainty : Significance : 3 sigma Freq or Vel. : 8.3 microns (REST )= 3.61E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 15 50 41.48 -03 53 18.1 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 37 Reference Code : 2010ApJS..187..172G Freq. targeted : 8.6 microns (IRS) Measurement : <17E-17 W/m^2^ < 1.70E-16 W m^-2^ Uncertainty : Significance : 3 sigma Freq or Vel. : 8.6 microns (REST )= 3.49E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 15 50 41.48 -03 53 18.1 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 38 Reference Code : 2009ApJ...705...14D Freq. targeted : 10 microns (IRS) Measurement : 1.53E-01 Jy = 1.53E-27 W m^-2^ Hz^-1^ Uncertainty : 2.09E-02 Jy = 2.09E-28 Significance : uncertainty Freq or Vel. : 10 microns (OBS )= 3.00E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From reprocessed raw data Qualifiers :
No. 39 Reference Code : 2007ApJ...671..124D Freq. targeted : [S IV] (Spitzer) Measurement : 0.07E-19 W/cm^2^ = 7.00E-17 W m^-2^ Uncertainty : 0.01E-19 W/cm^2^ = 1.00E-17 Significance : uncertainty Freq or Vel. : 10.51 microns (REST )= 2.85E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 40 Reference Code : 2010ApJ...709.1257T Freq. targeted : [S IV] 10.51 (IRS) Measurement : 5.19E-14 erg/s/cm^2^ = 5.19E-17 W m^-2^ Uncertainty : 0.34E-14 erg/s/cm^2^ = 3.40E-18 Significance : uncertainty Freq or Vel. : 10.51 microns (REST )= 2.85E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 15 50 41.5 -03 53 18 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : SH module
No. 41 Reference Code : 2004ApJ...605..156G Freq. targeted : 10.8 microns MIRLIN Measurement : 102 milliJy = 1.02E-27 W m^-2^ Hz^-1^ Uncertainty : 10 milliJy = 1.00E-28 Significance : statistical error Freq or Vel. : 10.8 microns (OBS )= 2.78E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 1.5" diam aperture
No. 42 Reference Code : 2009ApJ...701..658W Freq. targeted : PAH 11.2 (Spitzer) Measurement : 2.45E-20 W/cm^2^ = 2.45E-19 W m^-2^ Uncertainty : 0.48E-20 W/cm^2^ = 4.80E-20 Significance : uncertainty Freq or Vel. : 11.2 microns (REST )= 2.68E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 15 50 41.5 -03 53 18 (J2000) Spatial mode : Flux in fixed aperture Notes : From reprocessed raw data Qualifiers :
No. 43 Reference Code : 2010ApJS..187..172G Freq. targeted : 11.2 microns (IRS) Measurement : 22E-17 W/m^2^ = 2.20E-16 W m^-2^ Uncertainty : 3E-17 W/m^2^ = 3.00E-17 Significance : 1 sigma Freq or Vel. : 11.2 microns (REST )= 2.68E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 15 50 41.48 -03 53 18.1 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 44 Reference Code : 2010ApJS..187..172G Freq. targeted : 11.3 microns (IRS) Measurement : 47E-17 W/m^2^ = 4.70E-16 W m^-2^ Uncertainty : 6E-17 W/m^2^ = 6.00E-17 Significance : 1 sigma Freq or Vel. : 11.3 microns (REST )= 2.65E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 15 50 41.48 -03 53 18.1 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 45 Reference Code : 2010ApJS..187..172G Freq. targeted : 12.0 microns (IRS) Measurement : 38E-17 W/m^2^ = 3.80E-16 W m^-2^ Uncertainty : 5E-17 W/m^2^ = 5.00E-17 Significance : 1 sigma Freq or Vel. : 12.0 microns (REST )= 2.50E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 15 50 41.48 -03 53 18.1 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 46 Reference Code : 1990IRASF.C...0000M Freq. targeted : 12 microns (IRAS) Measurement : 1.849E-01 Jy = 1.85E-27 W m^-2^ Hz^-1^ Uncertainty : 15 % Jy = 2.77E-28 Significance : uncertainty Freq or Vel. : 12 microns (OBS )= 2.50E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: 154803.5 -034418 (B1950) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : IRAS quality flag = 3
No. 47 Reference Code : 2010ApJS..187..172G Freq. targeted : 12.6 microns (IRS) Measurement : 30E-17 W/m^2^ = 3.00E-16 W m^-2^ Uncertainty : 6E-17 W/m^2^ = 6.00E-17 Significance : 1 sigma Freq or Vel. : 12.6 microns (REST )= 2.38E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 15 50 41.48 -03 53 18.1 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 48 Reference Code : 2010ApJ...709.1257T Freq. targeted : [Ne II] 12.81 (IRS) Measurement : 5.57E-14 erg/s/cm^2^ = 5.57E-17 W m^-2^ Uncertainty : 0.28E-14 erg/s/cm^2^ = 2.80E-18 Significance : uncertainty Freq or Vel. : 12.81 microns (REST )= 2.34E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 15 50 41.5 -03 53 18 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : SH module
No. 49 Reference Code : 2011ApJS..195...17W Freq. targeted : [Ne II] 12.81 Measurement : 5.57E-21 W/cm^2^ = 5.57E-17 W m^-2^ Uncertainty : W/cm^2^ = 0.00E+00 Significance : no uncertainty reported Freq or Vel. : 12.81 microns (REST )= 2.34E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Not reported in paper Notes : Averaged from previously published data Qualifiers :
No. 50 Reference Code : 2007ApJ...671..124D Freq. targeted : [Ne II] (Spitzer) Measurement : 0.07E-19 W/cm^2^ = 7.00E-17 W m^-2^ Uncertainty : 0.01E-19 W/cm^2^ = 1.00E-17 Significance : uncertainty Freq or Vel. : 12.81 microns (REST )= 2.34E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 51 Reference Code : 2010ApJ...709.1257T Freq. targeted : [Ne V] 14.32 (IRS) Measurement : 6.08E-14 erg/s/cm^2^ = 6.08E-17 W m^-2^ Uncertainty : 0.26E-14 erg/s/cm^2^ = 2.60E-18 Significance : uncertainty Freq or Vel. : 14.32 microns (REST )= 2.09E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 15 50 41.5 -03 53 18 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : SH module
No. 52 Reference Code : 2011ApJS..195...17W Freq. targeted : [Ne V] 14.32 Measurement : 6.08E-21 W/cm^2^ = 6.08E-17 W m^-2^ Uncertainty : W/cm^2^ = 0.00E+00 Significance : no uncertainty reported Freq or Vel. : 14.32 microns (REST )= 2.09E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Not reported in paper Notes : Averaged from previously published data Qualifiers :
No. 53 Reference Code : 2007ApJ...671..124D Freq. targeted : [Ne V] 14.32 Spitzer Measurement : 0.10E-19 W/cm^2^ = 1.00E-16 W m^-2^ Uncertainty : 0.01E-19 W/cm^2^ = 1.00E-17 Significance : uncertainty Freq or Vel. : 14.32 microns (REST )= 2.09E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 54 Reference Code : 2009ApJ...705...14D Freq. targeted : 14.7 microns (IRS) Measurement : 2.99E-01 Jy = 2.99E-27 W m^-2^ Hz^-1^ Uncertainty : 1.86E-02 Jy = 1.86E-28 Significance : uncertainty Freq or Vel. : 14.7 microns (OBS )= 2.04E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From reprocessed raw data Qualifiers :
No. 55 Reference Code : 2007ApJ...671..124D Freq. targeted : 15 microns (Spitzer) Measurement : 3.40E-19 W/cm^2^/microns = 2.55E-27 W m^-2^ Hz^-1^ Uncertainty : 0.09E-19 W/cm^2^/microns = 6.75E-29 Significance : uncertainty Freq or Vel. : 15.00 microns (OBS )= 2.00E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 56 Reference Code : 2010ApJ...709.1257T Freq. targeted : [Ne III] 15.56 (IRS) Measurement : 9.35E-14 erg/s/cm^2^ = 9.35E-17 W m^-2^ Uncertainty : 0.32E-14 erg/s/cm^2^ = 3.20E-18 Significance : uncertainty Freq or Vel. : 15.56 microns (REST )= 1.93E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 15 50 41.5 -03 53 18 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : SH module
No. 57 Reference Code : 2011ApJS..195...17W Freq. targeted : [Ne III] 15.56 Measurement : 9.35E-21 W/cm^2^ = 9.35E-17 W m^-2^ Uncertainty : W/cm^2^ = 0.00E+00 Significance : no uncertainty reported Freq or Vel. : 15.56 microns (REST )= 1.93E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Not reported in paper Notes : Averaged from previously published data Qualifiers :
No. 58 Reference Code : 2007ApJ...671..124D Freq. targeted : [Ne III] (Spitzer) Measurement : 0.15E-19 W/cm^2^ = 1.50E-16 W m^-2^ Uncertainty : 0.01E-19 W/cm^2^ = 1.00E-17 Significance : uncertainty Freq or Vel. : 15.56 microns (REST )= 1.93E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 59 Reference Code : 2010ApJS..187..172G Freq. targeted : 17.0 microns (IRS) Measurement : <39E-17 W/m^2^ < 3.90E-16 W m^-2^ Uncertainty : Significance : 3 sigma Freq or Vel. : 17.0 microns (REST )= 1.76E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 15 50 41.48 -03 53 18.1 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 60 Reference Code : 2010ApJ...709.1257T Freq. targeted : [S III] 18.71 (IRS) Measurement : 2.72E-14 erg/s/cm^2^ = 2.72E-17 W m^-2^ Uncertainty : 0.48E-14 erg/s/cm^2^ = 4.80E-18 Significance : uncertainty Freq or Vel. : 18.71 microns (REST )= 1.60E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 15 50 41.5 -03 53 18 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : SH module
No. 61 Reference Code : 2010ApJ...709.1257T Freq. targeted : [S III] 18.71 (IRS) Measurement : <1.63E-14 erg/s/cm^2^ < 1.63E-17 W m^-2^ Uncertainty : Significance : uncertainty Freq or Vel. : 18.71 microns (REST )= 1.60E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 15 50 41.5 -03 53 18 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : LH module
No. 62 Reference Code : 2007ApJ...671..124D Freq. targeted : [S III] 18.7 Spitzer Measurement : 0.09E-19 W/cm^2^ = 9.00E-17 W m^-2^ Uncertainty : 0.01E-19 W/cm^2^ = 1.00E-17 Significance : uncertainty Freq or Vel. : 18.71 microns (REST )= 1.60E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 63 Reference Code : 2007ApJ...671..124D Freq. targeted : 20 microns (Spitzer) Measurement : 3.48E-19 W/cm^2^/microns = 4.64E-27 W m^-2^ Hz^-1^ Uncertainty : 0.08E-19 W/cm^2^/microns = 1.07E-28 Significance : uncertainty Freq or Vel. : 20.00 microns (OBS )= 1.50E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 64 Reference Code : 2009ApJ...705...14D Freq. targeted : 20 microns (IRS) Measurement : 4.22E-01 Jy = 4.22E-27 W m^-2^ Hz^-1^ Uncertainty : 5.74E-03 Jy = 5.74E-29 Significance : uncertainty Freq or Vel. : 20 microns (OBS )= 1.50E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From reprocessed raw data Qualifiers :
No. 65 Reference Code : 2013SSTSLC4.2....0C Freq. targeted : 24 microns (MIPS) Measurement : 5.6796E+05 microJy = 5.68E-27 W m^-2^ Hz^-1^ Uncertainty : 3.3410E+02 microJy = 3.34E-30 Significance : uncertainty Freq or Vel. : 23.68 microns (OBS )= 1.27E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Modelled datum Notes : From new raw data Qualifiers : PSF fit
No. 66 Reference Code : 2013SSTSLC4.2....0C Freq. targeted : 24 microns (MIPS) Measurement : 5.5639E+05 microJy = 5.56E-27 W m^-2^ Hz^-1^ Uncertainty : 1.9218E+02 microJy = 1.92E-30 Significance : uncertainty Freq or Vel. : 23.68 microns (OBS )= 1.27E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 14.7" aperture
No. 67 Reference Code : 2007ApJ...671..124D Freq. targeted : [Ne V] 24.32 Spitzer Measurement : 0.09E-19 W/cm^2^ = 9.00E-17 W m^-2^ Uncertainty : 0.01E-19 W/cm^2^ = 1.00E-17 Significance : uncertainty Freq or Vel. : 24.32 microns (REST )= 1.23E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 68 Reference Code : 2010ApJ...709.1257T Freq. targeted : [Ne V] 24.32 (IRS) Measurement : 8.90E-14 erg/s/cm^2^ = 8.90E-17 W m^-2^ Uncertainty : 0.22E-14 erg/s/cm^2^ = 2.20E-18 Significance : uncertainty Freq or Vel. : 24.32 microns (REST )= 1.23E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 15 50 41.5 -03 53 18 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : LH module
No. 69 Reference Code : 1990IRASF.C...0000M Freq. targeted : 25 microns (IRAS) Measurement : 7.287E-01 Jy = 7.29E-27 W m^-2^ Hz^-1^ Uncertainty : 8 % Jy = 1.48E-28 Significance : uncertainty Freq or Vel. : 25 microns (OBS )= 1.20E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: 154803.5 -034418 (B1950) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : IRAS quality flag = 3
No. 70 Reference Code : 2010ApJ...709.1257T Freq. targeted : [O IV] 25.89 (IRS) Measurement : 35.0E-14 erg/s/cm^2^ = 3.50E-16 W m^-2^ Uncertainty : 0.29E-14 erg/s/cm^2^ = 2.90E-18 Significance : uncertainty Freq or Vel. : 25.89 microns (REST )= 1.16E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 15 50 41.5 -03 53 18 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : LH module
No. 71 Reference Code : 2011ApJS..195...17W Freq. targeted : [O IV] 25.89 Measurement : 35.0E-21 W/cm^2^ = 3.50E-16 W m^-2^ Uncertainty : W/cm^2^ = 0.00E+00 Significance : no uncertainty reported Freq or Vel. : 25.89 microns (REST )= 1.16E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Not reported in paper Notes : Averaged from previously published data Qualifiers :
No. 72 Reference Code : 2007ApJ...671..124D Freq. targeted : [O IV] (Spitzer) Measurement : 0.34E-19 W/cm^2^ = 3.40E-16 W m^-2^ Uncertainty : 0.01E-19 W/cm^2^ = 1.00E-17 Significance : uncertainty Freq or Vel. : 25.89 microns (REST )= 1.16E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 73 Reference Code : 2009ApJ...705...14D Freq. targeted : 30 microns (IRS) Measurement : 4.92E-01 Jy = 4.92E-27 W m^-2^ Hz^-1^ Uncertainty : 8.65E-03 Jy = 8.65E-29 Significance : uncertainty Freq or Vel. : 30 microns (OBS )= 9.99E+12 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From reprocessed raw data Qualifiers :
No. 74 Reference Code : 2007ApJ...671..124D Freq. targeted : 30 microns (Spitzer) Measurement : 2.23E-19 W/cm^2^/microns = 6.69E-27 W m^-2^ Hz^-1^ Uncertainty : 0.04E-19 W/cm^2^/microns = 1.20E-28 Significance : uncertainty Freq or Vel. : 30.00 microns (OBS )= 9.99E+12 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 75 Reference Code : 2011ApJS..195...17W Freq. targeted : [S III] 33.48 Measurement : 5.20E-21 W/cm^2^ = 5.20E-17 W m^-2^ Uncertainty : W/cm^2^ = 0.00E+00 Significance : no uncertainty reported Freq or Vel. : 33.48 microns (REST )= 8.95E+12 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Not reported in paper Notes : Averaged from previously published data Qualifiers :
No. 76 Reference Code : 2010ApJ...709.1257T Freq. targeted : [S III] 33.48 (IRS) Measurement : 5.20E-14 erg/s/cm^2^ = 5.20E-17 W m^-2^ Uncertainty : 0.82E-14 erg/s/cm^2^ = 8.20E-18 Significance : uncertainty Freq or Vel. : 33.48 microns (REST )= 8.95E+12 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 15 50 41.5 -03 53 18 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : LH module
No. 77 Reference Code : 2011ApJS..195...17W Freq. targeted : [Si II] 34.28 Measurement : 5.13E-21 W/cm^2^ = 5.13E-17 W m^-2^ Uncertainty : W/cm^2^ = 0.00E+00 Significance : no uncertainty reported Freq or Vel. : 34.28 microns (REST )= 8.75E+12 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Not reported in paper Notes : Averaged from previously published data Qualifiers :
No. 78 Reference Code : 2010ApJ...709.1257T Freq. targeted : [Si II] 34.82 (IRS) Measurement : 5.13E-14 erg/s/cm^2^ = 5.13E-17 W m^-2^ Uncertainty : 0.82E-14 erg/s/cm^2^ = 8.20E-18 Significance : uncertainty Freq or Vel. : 34.82 microns (REST )= 8.61E+12 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 15 50 41.5 -03 53 18 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : LH module
No. 79 Reference Code : 1990IRASF.C...0000M Freq. targeted : 60 microns (IRAS) Measurement : 1.072E+00 Jy = 1.07E-26 W m^-2^ Hz^-1^ Uncertainty : 8 % Jy = 8.58E-28 Significance : uncertainty Freq or Vel. : 60 microns (OBS )= 5.00E+12 Hz Frequency mode : Broad-band measurement Coord. targeted: 154803.5 -034418 (B1950) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : IRAS quality flag = 2
No. 80 Reference Code : 1990IRASF.C...0000M Freq. targeted : 100 microns (IRAS) Measurement : <4.054E+00 Jy < 4.05E-26 W m^-2^ Hz^-1^ Uncertainty : Significance : 90% confidence Freq or Vel. : 100 microns (OBS )= 3.00E+12 Hz Frequency mode : Broad-band measurement Coord. targeted: 154803.5 -034418 (B1950) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers :
No. 81 Reference Code : 1998AJ....115.1693C Freq. targeted : 1.4GHz Measurement : 42.2 milliJy = 4.22E-28 W m^-2^ Hz^-1^ Uncertainty : 1.4 milliJy = 1.40E-29 Significance : uncertainty Freq or Vel. : 1.40 GHz (OBS )= 1.40E+09 Hz Frequency mode : Broad-band measurement Coord. targeted: 15 50 41.47 -03 53 17.1 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :

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