NASA/IPAC EXTRAGALACTIC DATABASE
Date and Time of the Query: 2019-06-18 T20:00:34 PDT
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Spectral Energy Distribution (SED) for MCG -03-58-007:

79 Data Points
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Photometric Data --- Published and Homogenized [Frequency, Flux Density] Units

  Published UnitsHomogenized Units [Frequency, Flux Density]  
No.Observed PassbandMeasurementUncertaintyUnitsFreq (Hz)MeasurementUncertaintyUnitsModeAperture/QualifiersReference CodeNo.
1 2-10 keV (XMM) 91E-14 ... erg/s/cm^2^ 1.45E+18 6.28E-08 ... Jy Broad-band 2011MNRAS.413.1206B 1
2 J (ESO/SPM) 20.0 +/- 1.33 milliJy 2.50E+14 2.00E-02 +/- 1.33E-03 Jy Broad-band 15" aperture 1995ApJ...453..616S 2
3 J (2MASS/CTIO) 13.007 +/- 0.062 mag 2.43E+14 9.99E-03 +/- 5.71E-04 Jy Broad-band Profile-fit; Poor quality 2006AJ....131.1163S 3
4 J (2MASS/CTIO) 12.546 +/- 0.01 mag 2.43E+14 1.53E-02 +/- 1.41E-04 Jy Broad-band 4" aperture 2006AJ....131.1163S 4
5 J 11.945 +/- 0.027 mag 2.40E+14 2.65E-02 +/- 6.68E-04 Jy Broad-band 33.6 x 22.2 arcsec integration area. 20032MASX.C.......: 5
6 J 11.892 +/- 0.030 mag 2.40E+14 2.79E-02 +/- 7.81E-04 Jy Broad-band 20032MASX.C.......: 6
7 J_14arcsec (2MASS) 12.272 +/- 0.012 mag 2.40E+14 1.96E-02 +/- 2.18E-04 Jy Broad-band 14.0 x 14.0 arcsec aperture. 20032MASX.C.......: 7
8 H (ESO/SPM) 29.7 +/- 1.98 milliJy 1.90E+14 2.97E-02 +/- 1.98E-03 Jy Broad-band 15" aperture 1995ApJ...453..616S 8
9 H 11.148 +/- 0.040 mag 1.82E+14 3.56E-02 +/- 1.33E-03 Jy Broad-band 33.6 x 22.2 arcsec integration area. 20032MASX.C.......: 9
10 H 11.073 +/- 0.040 mag 1.82E+14 3.81E-02 +/- 1.43E-03 Jy Broad-band 20032MASX.C.......: 10
11 H_14arcsec (2MASS) 11.404 +/- 0.014 mag 1.82E+14 2.81E-02 +/- 3.65E-04 Jy Broad-band 14.0 x 14.0 arcsec aperture. 20032MASX.C.......: 11
12 H (2MASS/CTIO) 11.642 +/- 0.01 mag 1.80E+14 2.26E-02 +/- 2.08E-04 Jy Broad-band 4" aperture 2006AJ....131.1163S 12
13 H (2MASS/CTIO) 11.98 +/- 0.07 mag 1.80E+14 1.65E-02 +/- 1.07E-03 Jy Broad-band Profile-fit 2006AJ....131.1163S 13
14 K_s (2MASS/CTIO) 10.958 +/- 0.038 mag 1.39E+14 2.76E-02 +/- 9.66E-04 Jy Broad-band Profile-fit 2006AJ....131.1163S 14
15 K_s (2MASS/CTIO) 10.813 +/- 0.008 mag 1.39E+14 3.15E-02 +/- 2.32E-04 Jy Broad-band 4" aperture 2006AJ....131.1163S 15
16 K_s 10.456 +/- 0.033 mag 1.38E+14 4.38E-02 +/- 1.35E-03 Jy Broad-band 33.6 x 22.2 arcsec integration area. 20032MASX.C.......: 16
17 K_s_14arcsec (2MASS) 10.667 +/- 0.010 mag 1.38E+14 3.61E-02 +/- 3.34E-04 Jy Broad-band 14.0 x 14.0 arcsec aperture. 20032MASX.C.......: 17
18 K_s 10.407 +/- 0.031 mag 1.38E+14 4.58E-02 +/- 1.33E-03 Jy Broad-band 20032MASX.C.......: 18
19 K (ESO/SPM) 36.2 +/- 2.41 milliJy 1.36E+14 3.62E-02 +/- 2.41E-03 Jy Broad-band 15" aperture 1995ApJ...453..616S 19
20 PAH 3.3 (IRTF) 10.64E-14 ... erg/s/cm^2^ 9.08E+13 1.06E+10 ... Jy-Hz Line 2010PASJ...62.1509O 20
21 3.6 microns (IRAC) 8.94 +/- 0.07 mag 8.44E+13 7.46E-02 +/- 4.81E-03 Jy Broad-band 2010ApJS..187..172G 21
22 4.5 microns (IRAC) 8.25 +/- 0.07 mag 6.67E+13 9.01E-02 +/- 5.81E-03 Jy Broad-band 2010ApJS..187..172G 22
23 5.5 microns (IRS) 1.47E-01 +/- 8.75E-03 Jy 5.45E+13 1.47E-01 +/- 8.75E-03 Jy Broad-band 2009ApJ...705...14D 23
24 5.8 microns (IRAC) 7.49 +/- 0.05 mag 5.23E+13 1.16E-01 +/- 5.34E-03 Jy Broad-band 2010ApJS..187..172G 24
25 6 microns (Spitzer) 11.74E-19 +/- 0.75E-19 W/cm^2^/microns 5.00E+13 1.41E-01 +/- 9.01E-03 Jy Broad-band 2007ApJ...671..124D 25
26 PAH 6.2 (Spitzer) 5.58E-20 +/- 0.13E-20 W/cm^2^ 4.84E+13 5.58E+07 +/- 1.30E+06 Jy-Hz Line 2009ApJ...701..658W 26
27 PAH 6.2 (Spitzer) 0.55E-19 +/- 0.04E-19 W/cm^2^ 4.84E+13 5.50E+10 +/- 4.00E+09 Jy-Hz Line 2007ApJ...671..124D 27
28 6.2 microns (IRS) 87E-17 +/- 9E-17 W/m^2^ 4.84E+13 8.70E+10 +/- 9.00E+09 Jy-Hz Line 2010ApJS..187..172G 28
29 7.4 microns (IRS) 283E-17 +/- 32E-17 W/m^2^ 4.05E+13 2.83E+11 +/- 3.20E+10 Jy-Hz Line 2010ApJS..187..172G 29
30 7.6 microns (IRS) 122E-17 +/- 17E-17 W/m^2^ 3.94E+13 1.22E+11 +/- 1.70E+10 Jy-Hz Line 2010ApJS..187..172G 30
31 7.8 microns (IRS) 197E-17 +/- 11E-17 W/m^2^ 3.84E+13 1.97E+11 +/- 1.10E+10 Jy-Hz Line 2010ApJS..187..172G 31
32 8.0 microns (IRAC) 6.04 +/- 0.04 mag 3.81E+13 2.46E-01 +/- 9.07E-03 Jy Broad-band 2010ApJS..187..172G 32
33 8.3 microns (IRS) 124E-17 +/- 12E-17 W/m^2^ 3.61E+13 1.24E+11 +/- 1.20E+10 Jy-Hz Line 2010ApJS..187..172G 33
34 8.6 microns (IRS) 53E-17 +/- 10E-17 W/m^2^ 3.49E+13 5.30E+10 +/- 1.00E+10 Jy-Hz Line 2010ApJS..187..172G 34
35 [Ar III] (Spitzer) 0.02E-19 +/- 0.01E-19 W/cm^2^ 3.33E+13 2.00E+09 +/- 1.00E+09 Jy-Hz Line 2007ApJ...671..124D 35
36 10 microns (IRS) 2.78E-01 +/- 1.13E-02 Jy 3.00E+13 2.78E-01 +/- 1.13E-02 Jy Broad-band 2009ApJ...705...14D 36
37 [S IV] (Spitzer) 0.03E-19 +/- 0.02E-19 W/cm^2^ 2.85E+13 3.00E+09 +/- 2.00E+09 Jy-Hz Line 2007ApJ...671..124D 37
38 [S IV] 10.51 (IRS) 2.75E-14 +/- 0.21E-14 erg/s/cm^2^ 2.85E+13 2.75E+09 +/- 2.10E+08 Jy-Hz Line SH module 2010ApJ...709.1257T 38
39 10.8 microns MIRLIN 200 +/- 15 milliJy 2.78E+13 2.00E-01 +/- 1.50E-02 Jy Broad-band 1.5" diam aperture 2004ApJ...605..156G 39
40 PAH 11.2 (Spitzer) 5.03E-20 +/- 1.10E-20 W/cm^2^ 2.68E+13 5.03E+07 +/- 1.10E+07 Jy-Hz Line 2009ApJ...701..658W 40
41 11.2 microns (IRS) 28E-17 +/- 3E-17 W/m^2^ 2.68E+13 2.80E+10 +/- 3.00E+09 Jy-Hz Line 2010ApJS..187..172G 41
42 11.3 microns (IRS) 99E-17 +/- 6E-17 W/m^2^ 2.65E+13 9.90E+10 +/- 6.00E+09 Jy-Hz Line 2010ApJS..187..172G 42
43 12.0 microns (IRS) 42E-17 +/- 6E-17 W/m^2^ 2.50E+13 4.20E+10 +/- 6.00E+09 Jy-Hz Line 2010ApJS..187..172G 43
44 12 microns (IRAS) 2.769E-01 +/- 13 % Jy 2.50E+13 2.77E-01 +/- 3.60E-02 Jy Broad-band IRAS quality flag = 3 1990IRASF.C...0000M 44
45 12.6 microns (IRS) 66E-17 +/- 7E-17 W/m^2^ 2.38E+13 6.60E+10 +/- 7.00E+09 Jy-Hz Line 2010ApJS..187..172G 45
46 [Ne II] (Spitzer) 0.05E-19 +/- 0.04E-19 W/cm^2^ 2.34E+13 5.00E+09 +/- 4.00E+09 Jy-Hz Line 2007ApJ...671..124D 46
47 [Ne II] 12.81 (IRS) 8.52E-14 +/- 0.34E-14 erg/s/cm^2^ 2.34E+13 8.52E+09 +/- 3.40E+08 Jy-Hz Line SH module 2010ApJ...709.1257T 47
48 [Ne II] 12.81 8.52E-21 ... W/cm^2^ 2.34E+13 8.52E+09 ... Jy-Hz Line 2011ApJS..195...17W 48
49 [Ne V] 14.32 (IRS) 6.63E-14 +/- 0.33E-14 erg/s/cm^2^ 2.09E+13 6.63E+09 +/- 3.30E+08 Jy-Hz Line SH module 2010ApJ...709.1257T 49
50 [Ne V] 14.32 6.63E-21 ... W/cm^2^ 2.09E+13 6.63E+09 ... Jy-Hz Line 2011ApJS..195...17W 50
51 14.7 microns (IRS) 4.76E-01 +/- 1.21E-02 Jy 2.04E+13 4.76E-01 +/- 1.21E-02 Jy Broad-band 2009ApJ...705...14D 51
52 15 microns (Spitzer) 4.93E-19 +/- 0.08E-19 W/cm^2^/microns 2.00E+13 3.70E-01 +/- 6.00E-03 Jy Broad-band 2007ApJ...671..124D 52
53 [Ne III] 15.56 (IRS) 9.29E-14 +/- 0.37E-14 erg/s/cm^2^ 1.93E+13 9.29E+09 +/- 3.70E+08 Jy-Hz Line SH module 2010ApJ...709.1257T 53
54 [Ne III] (Spitzer) 0.10E-19 +/- 0.01E-19 W/cm^2^ 1.93E+13 1.00E+10 +/- 1.00E+09 Jy-Hz Line 2007ApJ...671..124D 54
55 [Ne III] 15.56 9.29E-21 ... W/cm^2^ 1.93E+13 9.29E+09 ... Jy-Hz Line 2011ApJS..195...17W 55
56 17.0 microns (IRS) 56E-17 +/- 14E-17 W/m^2^ 1.76E+13 5.60E+10 +/- 1.40E+10 Jy-Hz Line 2010ApJS..187..172G 56
57 [S III] 18.71 (IRS) 1.92E-14 +/- 0.36E-14 erg/s/cm^2^ 1.60E+13 1.92E+09 +/- 3.60E+08 Jy-Hz Line LH module 2010ApJ...709.1257T 57
58 [S III] 18.71 (IRS) 5.20E-14 +/- 0.60E-14 erg/s/cm^2^ 1.60E+13 5.20E+09 +/- 6.00E+08 Jy-Hz Line SH module 2010ApJ...709.1257T 58
59 [S III] 18.7 Spitzer 0.06E-19 +/- 0.01E-19 W/cm^2^ 1.60E+13 6.00E+09 +/- 1.00E+09 Jy-Hz Line 2007ApJ...671..124D 59
60 20 microns (IRS) 7.01E-01 +/- 2.02E-02 Jy 1.50E+13 7.01E-01 +/- 2.02E-02 Jy Broad-band 2009ApJ...705...14D 60
61 20 microns (Spitzer) 4.78E-19 +/- 0.08E-19 W/cm^2^/microns 1.50E+13 6.38E-01 +/- 1.07E-02 Jy Broad-band 2007ApJ...671..124D 61
62 24 microns (MIPS) 7.7066E+05 +/- 4.0561E+02 microJy 1.27E+13 7.71E-01 +/- 4.06E-04 Jy Broad-band PSF fit 2013SSTSLC4.2....0C 62
63 24 microns (MIPS) 7.7200E+05 +/- 3.3696E+02 microJy 1.27E+13 7.72E-01 +/- 3.37E-04 Jy Broad-band 14.7" aperture 2013SSTSLC4.2....0C 63
64 [Ne V] 24.32 (IRS) 3.91E-14 +/- 0.30E-14 erg/s/cm^2^ 1.23E+13 3.91E+09 +/- 3.00E+08 Jy-Hz Line LH module 2010ApJ...709.1257T 64
65 [Ne V] 24.32 Spitzer 0.10E-19 +/- 0.01E-19 W/cm^2^ 1.23E+13 1.00E+10 +/- 1.00E+09 Jy-Hz Line 2007ApJ...671..124D 65
66 25 microns (IRAS) 7.964E-01 +/- 17 % Jy 1.20E+13 7.96E-01 +/- 4.71E-02 Jy Broad-band IRAS quality flag = 3 1990IRASF.C...0000M 66
67 [O IV] 25.89 (IRS) 8.80E-14 +/- 0.34E-14 erg/s/cm^2^ 1.16E+13 8.80E+09 +/- 3.40E+08 Jy-Hz Line LH module 2010ApJ...709.1257T 67
68 [O IV] 25.89 8.80E-21 ... W/cm^2^ 1.16E+13 8.80E+09 ... Jy-Hz Line 2011ApJS..195...17W 68
69 [O IV] (Spitzer) 0.12E-19 +/- 0.01E-19 W/cm^2^ 1.16E+13 1.20E+10 +/- 1.00E+09 Jy-Hz Line 2007ApJ...671..124D 69
70 30 microns (IRS) 9.38E-01 +/- 1.45E-02 Jy 9.99E+12 9.38E-01 +/- 1.45E-02 Jy Broad-band 2009ApJ...705...14D 70
71 30 microns (Spitzer) 3.33E-19 +/- 0.07E-19 W/cm^2^/microns 9.99E+12 1.00E+00 +/- 2.10E-02 Jy Broad-band 2007ApJ...671..124D 71
72 [S III] 33.48 (IRS) ... <2.84E-14 erg/s/cm^2^ 8.95E+12 < 2.84E+09 Jy-Hz Line LH module 2010ApJ...709.1257T 72
73 [S III] 33.48 ... <2.84E-21 W/cm^2^ 8.95E+12 < 2.84E+09 Jy-Hz Line 2011ApJS..195...17W 73
74 [Si II] 34.28 11.7E-21 ... W/cm^2^ 8.75E+12 1.17E+10 ... Jy-Hz Line 2011ApJS..195...17W 74
75 [Si II] 34.82 (IRS) 11.7E-14 +/- 0.95E-14 erg/s/cm^2^ 8.61E+12 1.17E+10 +/- 9.50E+08 Jy-Hz Line LH module 2010ApJ...709.1257T 75
76 60 microns (IRAS) 2.421E+00 +/- 7 % Jy 5.00E+12 2.42E+00 +/- 1.70E-01 Jy Broad-band IRAS quality flag = 3 1990IRASF.C...0000M 76
77 100 microns (IRAS) 3.358E+00 +/- 7 % Jy 3.00E+12 3.36E+00 +/- 2.35E-01 Jy Broad-band IRAS quality flag = 2 1990IRASF.C...0000M 77
78 170 microns (ISO) 3.95 +/- 30 % Jy 1.76E+12 3.95E+00 +/- 1.19E+00 Jy Broad-band 2004A&A...422...39S 78
79 1.4GHz 12.7 +/- 0.6 milliJy 1.40E+09 1.27E-02 +/- 6.00E-04 Jy Broad-band 1998AJ....115.1693C 79


Detailed Information for Each Entry

 No. 1
Reference Code : 2011MNRAS.413.1206B
Freq. targeted : 2-10 keV (XMM)      
Measurement    :  91E-14      erg/s/cm^2^          = 9.10E-16 W m^-2^
Uncertainty    :              erg/s/cm^2^          = 0.00E+00
Significance   : no uncertainty reported
Freq or Vel.   :       6.00   keV          (OBS   )= 1.45E+18 Hz
Frequency mode : Broad-band measurement
Coord. targeted: 342.410         -19.272 (J2000)
Spatial mode   : Modelled datum
Notes          : From reprocessed raw data; NED frequency assigned to
                 mid-point of band in keV
Qualifiers     :                                         

No. 2 Reference Code : 1995ApJ...453..616S Freq. targeted : J (ESO/SPM) Measurement : 20.0 milliJy = 2.00E-28 W m^-2^ Hz^-1^ Uncertainty : 1.33 milliJy = 1.33E-29 Significance : rms uncertainty Freq or Vel. : 1.198 microns (OBS )= 2.50E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 224657.4 -193212 (B1950) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 15" aperture
No. 3 Reference Code : 2006AJ....131.1163S Freq. targeted : J (2MASS/CTIO) Measurement : 13.007 mag = 9.99E-29 W m^-2^ Hz^-1^ Uncertainty : 0.062 mag = 5.71E-30 Significance : uncertainty Freq or Vel. : 1.235 microns (OBS )= 2.43E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : Profile-fit; Poor quality
No. 4 Reference Code : 2006AJ....131.1163S Freq. targeted : J (2MASS/CTIO) Measurement : 12.546 mag = 1.53E-28 W m^-2^ Hz^-1^ Uncertainty : 0.01 mag = 1.41E-30 Significance : uncertainty Freq or Vel. : 1.235 microns (OBS )= 2.43E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 4" aperture
No. 5 Reference Code : 20032MASX.C.......: Freq. targeted : J Measurement : 11.945 mag = 2.65E-28 W m^-2^ Hz^-1^ Uncertainty : 0.027 mag = 6.68E-30 Significance : 1 sigma uncert. Freq or Vel. : 1.25 microns (OBS )= 2.40E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 224937.15 -191626.4 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 33.6 x 22.2 arcsec integration area.
No. 6 Reference Code : 20032MASX.C.......: Freq. targeted : J Measurement : 11.892 mag = 2.79E-28 W m^-2^ Hz^-1^ Uncertainty : 0.030 mag = 7.81E-30 Significance : 1 sigma uncert. Freq or Vel. : 1.25 microns (OBS )= 2.40E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 224937.15 -191626.4 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers :
No. 7 Reference Code : 20032MASX.C.......: Freq. targeted : J_14arcsec (2MASS) Measurement : 12.272 mag = 1.96E-28 W m^-2^ Hz^-1^ Uncertainty : 0.012 mag = 2.18E-30 Significance : 1 sigma uncert. Freq or Vel. : 1.25 microns (OBS )= 2.40E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 224937.15 -191626.4 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 14.0 x 14.0 arcsec aperture.
No. 8 Reference Code : 1995ApJ...453..616S Freq. targeted : H (ESO/SPM) Measurement : 29.7 milliJy = 2.97E-28 W m^-2^ Hz^-1^ Uncertainty : 1.98 milliJy = 1.98E-29 Significance : rms uncertainty Freq or Vel. : 1.580 microns (OBS )= 1.90E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 224657.4 -193212 (B1950) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 15" aperture
No. 9 Reference Code : 20032MASX.C.......: Freq. targeted : H Measurement : 11.148 mag = 3.56E-28 W m^-2^ Hz^-1^ Uncertainty : 0.040 mag = 1.33E-29 Significance : 1 sigma uncert. Freq or Vel. : 1.65 microns (OBS )= 1.82E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 224937.15 -191626.4 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 33.6 x 22.2 arcsec integration area.
No. 10 Reference Code : 20032MASX.C.......: Freq. targeted : H Measurement : 11.073 mag = 3.81E-28 W m^-2^ Hz^-1^ Uncertainty : 0.040 mag = 1.43E-29 Significance : 1 sigma uncert. Freq or Vel. : 1.65 microns (OBS )= 1.82E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 224937.15 -191626.4 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers :
No. 11 Reference Code : 20032MASX.C.......: Freq. targeted : H_14arcsec (2MASS) Measurement : 11.404 mag = 2.81E-28 W m^-2^ Hz^-1^ Uncertainty : 0.014 mag = 3.65E-30 Significance : 1 sigma uncert. Freq or Vel. : 1.65 microns (OBS )= 1.82E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 224937.15 -191626.4 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 14.0 x 14.0 arcsec aperture.
No. 12 Reference Code : 2006AJ....131.1163S Freq. targeted : H (2MASS/CTIO) Measurement : 11.642 mag = 2.26E-28 W m^-2^ Hz^-1^ Uncertainty : 0.01 mag = 2.08E-30 Significance : uncertainty Freq or Vel. : 1.662 microns (OBS )= 1.80E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 4" aperture
No. 13 Reference Code : 2006AJ....131.1163S Freq. targeted : H (2MASS/CTIO) Measurement : 11.98 mag = 1.65E-28 W m^-2^ Hz^-1^ Uncertainty : 0.07 mag = 1.07E-29 Significance : uncertainty Freq or Vel. : 1.662 microns (OBS )= 1.80E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : Profile-fit
No. 14 Reference Code : 2006AJ....131.1163S Freq. targeted : K_s (2MASS/CTIO) Measurement : 10.958 mag = 2.76E-28 W m^-2^ Hz^-1^ Uncertainty : 0.038 mag = 9.66E-30 Significance : uncertainty Freq or Vel. : 2.159 microns (OBS )= 1.39E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : Profile-fit
No. 15 Reference Code : 2006AJ....131.1163S Freq. targeted : K_s (2MASS/CTIO) Measurement : 10.813 mag = 3.15E-28 W m^-2^ Hz^-1^ Uncertainty : 0.008 mag = 2.32E-30 Significance : uncertainty Freq or Vel. : 2.159 microns (OBS )= 1.39E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 4" aperture
No. 16 Reference Code : 20032MASX.C.......: Freq. targeted : K_s Measurement : 10.456 mag = 4.38E-28 W m^-2^ Hz^-1^ Uncertainty : 0.033 mag = 1.35E-29 Significance : 1 sigma uncert. Freq or Vel. : 2.17 microns (OBS )= 1.38E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 224937.15 -191626.4 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 33.6 x 22.2 arcsec integration area.
No. 17 Reference Code : 20032MASX.C.......: Freq. targeted : K_s_14arcsec (2MASS) Measurement : 10.667 mag = 3.61E-28 W m^-2^ Hz^-1^ Uncertainty : 0.010 mag = 3.34E-30 Significance : 1 sigma uncert. Freq or Vel. : 2.17 microns (OBS )= 1.38E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 224937.15 -191626.4 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 14.0 x 14.0 arcsec aperture.
No. 18 Reference Code : 20032MASX.C.......: Freq. targeted : K_s Measurement : 10.407 mag = 4.58E-28 W m^-2^ Hz^-1^ Uncertainty : 0.031 mag = 1.33E-29 Significance : 1 sigma uncert. Freq or Vel. : 2.17 microns (OBS )= 1.38E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 224937.15 -191626.4 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers :
No. 19 Reference Code : 1995ApJ...453..616S Freq. targeted : K (ESO/SPM) Measurement : 36.2 milliJy = 3.62E-28 W m^-2^ Hz^-1^ Uncertainty : 2.41 milliJy = 2.41E-29 Significance : rms uncertainty Freq or Vel. : 2.210 microns (OBS )= 1.36E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 224657.4 -193212 (B1950) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 15" aperture
No. 20 Reference Code : 2010PASJ...62.1509O Freq. targeted : PAH 3.3 (IRTF) Measurement : 10.64E-14 erg/s/cm^2^ = 1.06E-16 W m^-2^ Uncertainty : erg/s/cm^2^ = 0.00E+00 Significance : no uncertainty reported Freq or Vel. : 3.3 microns (REST )= 9.08E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 21 Reference Code : 2010ApJS..187..172G Freq. targeted : 3.6 microns (IRAC) Measurement : 8.94 mag = 7.46E-28 W m^-2^ Hz^-1^ Uncertainty : 0.07 mag = 4.81E-29 Significance : uncertainty Freq or Vel. : 3.550 microns (OBS )= 8.44E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: 22 49 37.17 -19 16 26.2 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers :
No. 22 Reference Code : 2010ApJS..187..172G Freq. targeted : 4.5 microns (IRAC) Measurement : 8.25 mag = 9.01E-28 W m^-2^ Hz^-1^ Uncertainty : 0.07 mag = 5.81E-29 Significance : uncertainty Freq or Vel. : 4.493 microns (OBS )= 6.67E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: 22 49 37.17 -19 16 26.2 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers :
No. 23 Reference Code : 2009ApJ...705...14D Freq. targeted : 5.5 microns (IRS) Measurement : 1.47E-01 Jy = 1.47E-27 W m^-2^ Hz^-1^ Uncertainty : 8.75E-03 Jy = 8.75E-29 Significance : uncertainty Freq or Vel. : 5.5 microns (OBS )= 5.45E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From reprocessed raw data Qualifiers :
No. 24 Reference Code : 2010ApJS..187..172G Freq. targeted : 5.8 microns (IRAC) Measurement : 7.49 mag = 1.16E-27 W m^-2^ Hz^-1^ Uncertainty : 0.05 mag = 5.34E-29 Significance : uncertainty Freq or Vel. : 5.731 microns (OBS )= 5.23E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: 22 49 37.17 -19 16 26.2 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers :
No. 25 Reference Code : 2007ApJ...671..124D Freq. targeted : 6 microns (Spitzer) Measurement : 11.74E-19 W/cm^2^/microns = 1.41E-27 W m^-2^ Hz^-1^ Uncertainty : 0.75E-19 W/cm^2^/microns = 9.01E-29 Significance : uncertainty Freq or Vel. : 6.00 microns (OBS )= 5.00E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 26 Reference Code : 2009ApJ...701..658W Freq. targeted : PAH 6.2 (Spitzer) Measurement : 5.58E-20 W/cm^2^ = 5.58E-19 W m^-2^ Uncertainty : 0.13E-20 W/cm^2^ = 1.30E-20 Significance : uncertainty Freq or Vel. : 6.2 microns (REST )= 4.84E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 22 49 37.1 -19 16 26 (J2000) Spatial mode : Flux in fixed aperture Notes : From reprocessed raw data Qualifiers :
No. 27 Reference Code : 2007ApJ...671..124D Freq. targeted : PAH 6.2 (Spitzer) Measurement : 0.55E-19 W/cm^2^ = 5.50E-16 W m^-2^ Uncertainty : 0.04E-19 W/cm^2^ = 4.00E-17 Significance : uncertainty Freq or Vel. : 6.2 microns (REST )= 4.84E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 28 Reference Code : 2010ApJS..187..172G Freq. targeted : 6.2 microns (IRS) Measurement : 87E-17 W/m^2^ = 8.70E-16 W m^-2^ Uncertainty : 9E-17 W/m^2^ = 9.00E-17 Significance : 1 sigma Freq or Vel. : 6.2 microns (REST )= 4.84E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 22 49 37.17 -19 16 26.2 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 29 Reference Code : 2010ApJS..187..172G Freq. targeted : 7.4 microns (IRS) Measurement : 283E-17 W/m^2^ = 2.83E-15 W m^-2^ Uncertainty : 32E-17 W/m^2^ = 3.20E-16 Significance : 1 sigma Freq or Vel. : 7.4 microns (REST )= 4.05E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 22 49 37.17 -19 16 26.2 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 30 Reference Code : 2010ApJS..187..172G Freq. targeted : 7.6 microns (IRS) Measurement : 122E-17 W/m^2^ = 1.22E-15 W m^-2^ Uncertainty : 17E-17 W/m^2^ = 1.70E-16 Significance : 1 sigma Freq or Vel. : 7.6 microns (REST )= 3.94E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 22 49 37.17 -19 16 26.2 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 31 Reference Code : 2010ApJS..187..172G Freq. targeted : 7.8 microns (IRS) Measurement : 197E-17 W/m^2^ = 1.97E-15 W m^-2^ Uncertainty : 11E-17 W/m^2^ = 1.10E-16 Significance : 1 sigma Freq or Vel. : 7.8 microns (REST )= 3.84E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 22 49 37.17 -19 16 26.2 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 32 Reference Code : 2010ApJS..187..172G Freq. targeted : 8.0 microns (IRAC) Measurement : 6.04 mag = 2.46E-27 W m^-2^ Hz^-1^ Uncertainty : 0.04 mag = 9.07E-29 Significance : uncertainty Freq or Vel. : 7.872 microns (OBS )= 3.81E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: 22 49 37.17 -19 16 26.2 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers :
No. 33 Reference Code : 2010ApJS..187..172G Freq. targeted : 8.3 microns (IRS) Measurement : 124E-17 W/m^2^ = 1.24E-15 W m^-2^ Uncertainty : 12E-17 W/m^2^ = 1.20E-16 Significance : 1 sigma Freq or Vel. : 8.3 microns (REST )= 3.61E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 22 49 37.17 -19 16 26.2 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 34 Reference Code : 2010ApJS..187..172G Freq. targeted : 8.6 microns (IRS) Measurement : 53E-17 W/m^2^ = 5.30E-16 W m^-2^ Uncertainty : 10E-17 W/m^2^ = 1.00E-16 Significance : 1 sigma Freq or Vel. : 8.6 microns (REST )= 3.49E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 22 49 37.17 -19 16 26.2 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 35 Reference Code : 2007ApJ...671..124D Freq. targeted : [Ar III] (Spitzer) Measurement : 0.02E-19 W/cm^2^ = 2.00E-17 W m^-2^ Uncertainty : 0.01E-19 W/cm^2^ = 1.00E-17 Significance : uncertainty Freq or Vel. : 8.99 microns (REST )= 3.33E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 36 Reference Code : 2009ApJ...705...14D Freq. targeted : 10 microns (IRS) Measurement : 2.78E-01 Jy = 2.78E-27 W m^-2^ Hz^-1^ Uncertainty : 1.13E-02 Jy = 1.13E-28 Significance : uncertainty Freq or Vel. : 10 microns (OBS )= 3.00E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From reprocessed raw data Qualifiers :
No. 37 Reference Code : 2007ApJ...671..124D Freq. targeted : [S IV] (Spitzer) Measurement : 0.03E-19 W/cm^2^ = 3.00E-17 W m^-2^ Uncertainty : 0.02E-19 W/cm^2^ = 2.00E-17 Significance : uncertainty Freq or Vel. : 10.51 microns (REST )= 2.85E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 38 Reference Code : 2010ApJ...709.1257T Freq. targeted : [S IV] 10.51 (IRS) Measurement : 2.75E-14 erg/s/cm^2^ = 2.75E-17 W m^-2^ Uncertainty : 0.21E-14 erg/s/cm^2^ = 2.10E-18 Significance : uncertainty Freq or Vel. : 10.51 microns (REST )= 2.85E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 22 49 37.1 -19 16 26 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : SH module
No. 39 Reference Code : 2004ApJ...605..156G Freq. targeted : 10.8 microns MIRLIN Measurement : 200 milliJy = 2.00E-27 W m^-2^ Hz^-1^ Uncertainty : 15 milliJy = 1.50E-28 Significance : statistical error Freq or Vel. : 10.8 microns (OBS )= 2.78E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 1.5" diam aperture
No. 40 Reference Code : 2009ApJ...701..658W Freq. targeted : PAH 11.2 (Spitzer) Measurement : 5.03E-20 W/cm^2^ = 5.03E-19 W m^-2^ Uncertainty : 1.10E-20 W/cm^2^ = 1.10E-19 Significance : uncertainty Freq or Vel. : 11.2 microns (REST )= 2.68E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 22 49 37.1 -19 16 26 (J2000) Spatial mode : Flux in fixed aperture Notes : From reprocessed raw data Qualifiers :
No. 41 Reference Code : 2010ApJS..187..172G Freq. targeted : 11.2 microns (IRS) Measurement : 28E-17 W/m^2^ = 2.80E-16 W m^-2^ Uncertainty : 3E-17 W/m^2^ = 3.00E-17 Significance : 1 sigma Freq or Vel. : 11.2 microns (REST )= 2.68E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 22 49 37.17 -19 16 26.2 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 42 Reference Code : 2010ApJS..187..172G Freq. targeted : 11.3 microns (IRS) Measurement : 99E-17 W/m^2^ = 9.90E-16 W m^-2^ Uncertainty : 6E-17 W/m^2^ = 6.00E-17 Significance : 1 sigma Freq or Vel. : 11.3 microns (REST )= 2.65E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 22 49 37.17 -19 16 26.2 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 43 Reference Code : 2010ApJS..187..172G Freq. targeted : 12.0 microns (IRS) Measurement : 42E-17 W/m^2^ = 4.20E-16 W m^-2^ Uncertainty : 6E-17 W/m^2^ = 6.00E-17 Significance : 1 sigma Freq or Vel. : 12.0 microns (REST )= 2.50E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 22 49 37.17 -19 16 26.2 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 44 Reference Code : 1990IRASF.C...0000M Freq. targeted : 12 microns (IRAS) Measurement : 2.769E-01 Jy = 2.77E-27 W m^-2^ Hz^-1^ Uncertainty : 13 % Jy = 3.60E-28 Significance : uncertainty Freq or Vel. : 12 microns (OBS )= 2.50E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: 224657.4 -193212 (B1950) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : IRAS quality flag = 3
No. 45 Reference Code : 2010ApJS..187..172G Freq. targeted : 12.6 microns (IRS) Measurement : 66E-17 W/m^2^ = 6.60E-16 W m^-2^ Uncertainty : 7E-17 W/m^2^ = 7.00E-17 Significance : 1 sigma Freq or Vel. : 12.6 microns (REST )= 2.38E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 22 49 37.17 -19 16 26.2 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 46 Reference Code : 2007ApJ...671..124D Freq. targeted : [Ne II] (Spitzer) Measurement : 0.05E-19 W/cm^2^ = 5.00E-17 W m^-2^ Uncertainty : 0.04E-19 W/cm^2^ = 4.00E-17 Significance : uncertainty Freq or Vel. : 12.81 microns (REST )= 2.34E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 47 Reference Code : 2010ApJ...709.1257T Freq. targeted : [Ne II] 12.81 (IRS) Measurement : 8.52E-14 erg/s/cm^2^ = 8.52E-17 W m^-2^ Uncertainty : 0.34E-14 erg/s/cm^2^ = 3.40E-18 Significance : uncertainty Freq or Vel. : 12.81 microns (REST )= 2.34E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 22 49 37.1 -19 16 26 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : SH module
No. 48 Reference Code : 2011ApJS..195...17W Freq. targeted : [Ne II] 12.81 Measurement : 8.52E-21 W/cm^2^ = 8.52E-17 W m^-2^ Uncertainty : W/cm^2^ = 0.00E+00 Significance : no uncertainty reported Freq or Vel. : 12.81 microns (REST )= 2.34E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Not reported in paper Notes : Averaged from previously published data Qualifiers :
No. 49 Reference Code : 2010ApJ...709.1257T Freq. targeted : [Ne V] 14.32 (IRS) Measurement : 6.63E-14 erg/s/cm^2^ = 6.63E-17 W m^-2^ Uncertainty : 0.33E-14 erg/s/cm^2^ = 3.30E-18 Significance : uncertainty Freq or Vel. : 14.32 microns (REST )= 2.09E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 22 49 37.1 -19 16 26 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : SH module
No. 50 Reference Code : 2011ApJS..195...17W Freq. targeted : [Ne V] 14.32 Measurement : 6.63E-21 W/cm^2^ = 6.63E-17 W m^-2^ Uncertainty : W/cm^2^ = 0.00E+00 Significance : no uncertainty reported Freq or Vel. : 14.32 microns (REST )= 2.09E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Not reported in paper Notes : Averaged from previously published data Qualifiers :
No. 51 Reference Code : 2009ApJ...705...14D Freq. targeted : 14.7 microns (IRS) Measurement : 4.76E-01 Jy = 4.76E-27 W m^-2^ Hz^-1^ Uncertainty : 1.21E-02 Jy = 1.21E-28 Significance : uncertainty Freq or Vel. : 14.7 microns (OBS )= 2.04E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From reprocessed raw data Qualifiers :
No. 52 Reference Code : 2007ApJ...671..124D Freq. targeted : 15 microns (Spitzer) Measurement : 4.93E-19 W/cm^2^/microns = 3.70E-27 W m^-2^ Hz^-1^ Uncertainty : 0.08E-19 W/cm^2^/microns = 6.00E-29 Significance : uncertainty Freq or Vel. : 15.00 microns (OBS )= 2.00E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 53 Reference Code : 2010ApJ...709.1257T Freq. targeted : [Ne III] 15.56 (IRS) Measurement : 9.29E-14 erg/s/cm^2^ = 9.29E-17 W m^-2^ Uncertainty : 0.37E-14 erg/s/cm^2^ = 3.70E-18 Significance : uncertainty Freq or Vel. : 15.56 microns (REST )= 1.93E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 22 49 37.1 -19 16 26 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : SH module
No. 54 Reference Code : 2007ApJ...671..124D Freq. targeted : [Ne III] (Spitzer) Measurement : 0.10E-19 W/cm^2^ = 1.00E-16 W m^-2^ Uncertainty : 0.01E-19 W/cm^2^ = 1.00E-17 Significance : uncertainty Freq or Vel. : 15.56 microns (REST )= 1.93E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 55 Reference Code : 2011ApJS..195...17W Freq. targeted : [Ne III] 15.56 Measurement : 9.29E-21 W/cm^2^ = 9.29E-17 W m^-2^ Uncertainty : W/cm^2^ = 0.00E+00 Significance : no uncertainty reported Freq or Vel. : 15.56 microns (REST )= 1.93E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Not reported in paper Notes : Averaged from previously published data Qualifiers :
No. 56 Reference Code : 2010ApJS..187..172G Freq. targeted : 17.0 microns (IRS) Measurement : 56E-17 W/m^2^ = 5.60E-16 W m^-2^ Uncertainty : 14E-17 W/m^2^ = 1.40E-16 Significance : 1 sigma Freq or Vel. : 17.0 microns (REST )= 1.76E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 22 49 37.17 -19 16 26.2 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 57 Reference Code : 2010ApJ...709.1257T Freq. targeted : [S III] 18.71 (IRS) Measurement : 1.92E-14 erg/s/cm^2^ = 1.92E-17 W m^-2^ Uncertainty : 0.36E-14 erg/s/cm^2^ = 3.60E-18 Significance : uncertainty Freq or Vel. : 18.71 microns (REST )= 1.60E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 22 49 37.1 -19 16 26 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : LH module
No. 58 Reference Code : 2010ApJ...709.1257T Freq. targeted : [S III] 18.71 (IRS) Measurement : 5.20E-14 erg/s/cm^2^ = 5.20E-17 W m^-2^ Uncertainty : 0.60E-14 erg/s/cm^2^ = 6.00E-18 Significance : uncertainty Freq or Vel. : 18.71 microns (REST )= 1.60E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 22 49 37.1 -19 16 26 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : SH module
No. 59 Reference Code : 2007ApJ...671..124D Freq. targeted : [S III] 18.7 Spitzer Measurement : 0.06E-19 W/cm^2^ = 6.00E-17 W m^-2^ Uncertainty : 0.01E-19 W/cm^2^ = 1.00E-17 Significance : uncertainty Freq or Vel. : 18.71 microns (REST )= 1.60E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 60 Reference Code : 2009ApJ...705...14D Freq. targeted : 20 microns (IRS) Measurement : 7.01E-01 Jy = 7.01E-27 W m^-2^ Hz^-1^ Uncertainty : 2.02E-02 Jy = 2.02E-28 Significance : uncertainty Freq or Vel. : 20 microns (OBS )= 1.50E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From reprocessed raw data Qualifiers :
No. 61 Reference Code : 2007ApJ...671..124D Freq. targeted : 20 microns (Spitzer) Measurement : 4.78E-19 W/cm^2^/microns = 6.38E-27 W m^-2^ Hz^-1^ Uncertainty : 0.08E-19 W/cm^2^/microns = 1.07E-28 Significance : uncertainty Freq or Vel. : 20.00 microns (OBS )= 1.50E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 62 Reference Code : 2013SSTSLC4.2....0C Freq. targeted : 24 microns (MIPS) Measurement : 7.7066E+05 microJy = 7.71E-27 W m^-2^ Hz^-1^ Uncertainty : 4.0561E+02 microJy = 4.06E-30 Significance : uncertainty Freq or Vel. : 23.68 microns (OBS )= 1.27E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Modelled datum Notes : From new raw data Qualifiers : PSF fit
No. 63 Reference Code : 2013SSTSLC4.2....0C Freq. targeted : 24 microns (MIPS) Measurement : 7.7200E+05 microJy = 7.72E-27 W m^-2^ Hz^-1^ Uncertainty : 3.3696E+02 microJy = 3.37E-30 Significance : uncertainty Freq or Vel. : 23.68 microns (OBS )= 1.27E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 14.7" aperture
No. 64 Reference Code : 2010ApJ...709.1257T Freq. targeted : [Ne V] 24.32 (IRS) Measurement : 3.91E-14 erg/s/cm^2^ = 3.91E-17 W m^-2^ Uncertainty : 0.30E-14 erg/s/cm^2^ = 3.00E-18 Significance : uncertainty Freq or Vel. : 24.32 microns (REST )= 1.23E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 22 49 37.1 -19 16 26 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : LH module
No. 65 Reference Code : 2007ApJ...671..124D Freq. targeted : [Ne V] 24.32 Spitzer Measurement : 0.10E-19 W/cm^2^ = 1.00E-16 W m^-2^ Uncertainty : 0.01E-19 W/cm^2^ = 1.00E-17 Significance : uncertainty Freq or Vel. : 24.32 microns (REST )= 1.23E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 66 Reference Code : 1990IRASF.C...0000M Freq. targeted : 25 microns (IRAS) Measurement : 7.964E-01 Jy = 7.96E-27 W m^-2^ Hz^-1^ Uncertainty : 17 % Jy = 4.71E-28 Significance : uncertainty Freq or Vel. : 25 microns (OBS )= 1.20E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: 224657.4 -193212 (B1950) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : IRAS quality flag = 3
No. 67 Reference Code : 2010ApJ...709.1257T Freq. targeted : [O IV] 25.89 (IRS) Measurement : 8.80E-14 erg/s/cm^2^ = 8.80E-17 W m^-2^ Uncertainty : 0.34E-14 erg/s/cm^2^ = 3.40E-18 Significance : uncertainty Freq or Vel. : 25.89 microns (REST )= 1.16E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 22 49 37.1 -19 16 26 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : LH module
No. 68 Reference Code : 2011ApJS..195...17W Freq. targeted : [O IV] 25.89 Measurement : 8.80E-21 W/cm^2^ = 8.80E-17 W m^-2^ Uncertainty : W/cm^2^ = 0.00E+00 Significance : no uncertainty reported Freq or Vel. : 25.89 microns (REST )= 1.16E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Not reported in paper Notes : Averaged from previously published data Qualifiers :
No. 69 Reference Code : 2007ApJ...671..124D Freq. targeted : [O IV] (Spitzer) Measurement : 0.12E-19 W/cm^2^ = 1.20E-16 W m^-2^ Uncertainty : 0.01E-19 W/cm^2^ = 1.00E-17 Significance : uncertainty Freq or Vel. : 25.89 microns (REST )= 1.16E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 70 Reference Code : 2009ApJ...705...14D Freq. targeted : 30 microns (IRS) Measurement : 9.38E-01 Jy = 9.38E-27 W m^-2^ Hz^-1^ Uncertainty : 1.45E-02 Jy = 1.45E-28 Significance : uncertainty Freq or Vel. : 30 microns (OBS )= 9.99E+12 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From reprocessed raw data Qualifiers :
No. 71 Reference Code : 2007ApJ...671..124D Freq. targeted : 30 microns (Spitzer) Measurement : 3.33E-19 W/cm^2^/microns = 1.00E-26 W m^-2^ Hz^-1^ Uncertainty : 0.07E-19 W/cm^2^/microns = 2.10E-28 Significance : uncertainty Freq or Vel. : 30.00 microns (OBS )= 9.99E+12 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 72 Reference Code : 2010ApJ...709.1257T Freq. targeted : [S III] 33.48 (IRS) Measurement : <2.84E-14 erg/s/cm^2^ < 2.84E-17 W m^-2^ Uncertainty : Significance : uncertainty Freq or Vel. : 33.48 microns (REST )= 8.95E+12 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 22 49 37.1 -19 16 26 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : LH module
No. 73 Reference Code : 2011ApJS..195...17W Freq. targeted : [S III] 33.48 Measurement : <2.84E-21 W/cm^2^ < 2.84E-17 W m^-2^ Uncertainty : Significance : no uncertainty reported Freq or Vel. : 33.48 microns (REST )= 8.95E+12 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Not reported in paper Notes : Averaged from previously published data Qualifiers :
No. 74 Reference Code : 2011ApJS..195...17W Freq. targeted : [Si II] 34.28 Measurement : 11.7E-21 W/cm^2^ = 1.17E-16 W m^-2^ Uncertainty : W/cm^2^ = 0.00E+00 Significance : no uncertainty reported Freq or Vel. : 34.28 microns (REST )= 8.75E+12 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Not reported in paper Notes : Averaged from previously published data Qualifiers :
No. 75 Reference Code : 2010ApJ...709.1257T Freq. targeted : [Si II] 34.82 (IRS) Measurement : 11.7E-14 erg/s/cm^2^ = 1.17E-16 W m^-2^ Uncertainty : 0.95E-14 erg/s/cm^2^ = 9.50E-18 Significance : uncertainty Freq or Vel. : 34.82 microns (REST )= 8.61E+12 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 22 49 37.1 -19 16 26 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : LH module
No. 76 Reference Code : 1990IRASF.C...0000M Freq. targeted : 60 microns (IRAS) Measurement : 2.421E+00 Jy = 2.42E-26 W m^-2^ Hz^-1^ Uncertainty : 7 % Jy = 1.70E-27 Significance : uncertainty Freq or Vel. : 60 microns (OBS )= 5.00E+12 Hz Frequency mode : Broad-band measurement Coord. targeted: 224657.4 -193212 (B1950) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : IRAS quality flag = 3
No. 77 Reference Code : 1990IRASF.C...0000M Freq. targeted : 100 microns (IRAS) Measurement : 3.358E+00 Jy = 3.36E-26 W m^-2^ Hz^-1^ Uncertainty : 7 % Jy = 2.35E-27 Significance : uncertainty Freq or Vel. : 100 microns (OBS )= 3.00E+12 Hz Frequency mode : Broad-band measurement Coord. targeted: 224657.4 -193212 (B1950) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : IRAS quality flag = 2
No. 78 Reference Code : 2004A&A...422...39S Freq. targeted : 170 microns (ISO) Measurement : 3.95 Jy = 3.95E-26 W m^-2^ Hz^-1^ Uncertainty : 30 % Jy = 1.18E-26 Significance : uncertainty Freq or Vel. : 170 microns (OBS )= 1.76E+12 Hz Frequency mode : Broad-band measurement Coord. targeted: 22 49 37.77 -19 16 02.3 (J2000) Spatial mode : Integrated from scans Notes : Averaged from previously published data Qualifiers :
No. 79 Reference Code : 1998AJ....115.1693C Freq. targeted : 1.4GHz Measurement : 12.7 milliJy = 1.27E-28 W m^-2^ Hz^-1^ Uncertainty : 0.6 milliJy = 6.00E-30 Significance : uncertainty Freq or Vel. : 1.40 GHz (OBS )= 1.40E+09 Hz Frequency mode : Broad-band measurement Coord. targeted: 22 49 37.08 -19 16 25.5 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :

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