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Date and Time of the Query: 2019-06-16 T22:47:48 PDT
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Spectral Energy Distribution (SED) for 2MASX J04405494-0822221:

85 Data Points
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Photometric Data --- Published and Homogenized [Frequency, Flux Density] Units

  Published UnitsHomogenized Units [Frequency, Flux Density]  
No.Observed PassbandMeasurementUncertaintyUnitsFreq (Hz)MeasurementUncertaintyUnitsModeAperture/QualifiersReference CodeNo.
1 2-10 keV 1.800E-14 ... W/m^2^ 1.45E+18 1.24E-06 ... Jy Broad-band Observed flux 2004A&A...418..465L 1
2 [O III] 5007 (SDSS) 0.35E-14 ... erg/s/cm^2^ 5.99E+14 3.50E+08 ... Jy-Hz Line 2010ApJ...720..786L 2
3 J (2MASS/CTIO) 13.609 +/- 0.074 mag 2.43E+14 5.74E-03 +/- 3.91E-04 Jy Broad-band Profile-fit; Poor quality 2006AJ....131.1163S 3
4 J (2MASS/CTIO) 13.068 +/- 0.014 mag 2.43E+14 9.45E-03 +/- 1.22E-04 Jy Broad-band 4" aperture 2006AJ....131.1163S 4
5 J (ESO/SPM) 16.3 +/- 1.09 milliJy 2.41E+14 1.63E-02 +/- 1.09E-03 Jy Broad-band 30" aperture 1995ApJ...453..616S 5
6 J 12.471 +/- 0.025 mag 2.40E+14 1.64E-02 +/- 3.81E-04 Jy Broad-band 25.8 x 17.0 arcsec integration area. 20032MASX.C.......: 6
7 J 12.190 +/- 0.029 mag 2.40E+14 2.12E-02 +/- 5.73E-04 Jy Broad-band 20032MASX.C.......: 7
8 J_14arcsec (2MASS) 12.704 +/- 0.014 mag 2.40E+14 1.32E-02 +/- 1.71E-04 Jy Broad-band 14.0 x 14.0 arcsec aperture. 20032MASX.C.......: 8
9 J_total 12.91 ... mag 2.40E+14 1.04E-02 ... Jy Broad-band 1996MNRAS.280..579H 9
10 H (ESO/SPM) 22.8 +/- 1.52 milliJy 1.84E+14 2.28E-02 +/- 1.52E-03 Jy Broad-band 30" aperture 1995ApJ...453..616S 10
11 H 11.656 +/- 0.031 mag 1.82E+14 2.23E-02 +/- 6.45E-04 Jy Broad-band 25.8 x 17.0 arcsec integration area. 20032MASX.C.......: 11
12 H 11.377 +/- 0.034 mag 1.82E+14 2.88E-02 +/- 9.16E-04 Jy Broad-band 20032MASX.C.......: 12
13 H_14arcsec (2MASS) 11.849 +/- 0.015 mag 1.82E+14 1.87E-02 +/- 2.59E-04 Jy Broad-band 14.0 x 14.0 arcsec aperture. 20032MASX.C.......: 13
14 H_total 12.04 ... mag 1.82E+14 1.50E-02 ... Jy Broad-band 1996MNRAS.280..579H 14
15 H (2MASS/CTIO) 12.134 +/- 0.009 mag 1.80E+14 1.43E-02 +/- 1.19E-04 Jy Broad-band 4" aperture 2006AJ....131.1163S 15
16 H (2MASS/CTIO) 12.582 +/- 0.083 mag 1.80E+14 9.50E-03 +/- 7.26E-04 Jy Broad-band Profile-fit 2006AJ....131.1163S 16
17 K_s (2MASS/CTIO) 11.502 +/- 0.039 mag 1.39E+14 1.67E-02 +/- 6.01E-04 Jy Broad-band Profile-fit 2006AJ....131.1163S 17
18 K_s (2MASS/CTIO) 11.325 +/- 0.014 mag 1.39E+14 1.97E-02 +/- 2.54E-04 Jy Broad-band 4" aperture 2006AJ....131.1163S 18
19 K_s 11.017 +/- 0.040 mag 1.38E+14 2.61E-02 +/- 9.81E-04 Jy Broad-band 25.8 x 17.0 arcsec integration area. 20032MASX.C.......: 19
20 K_s 10.920 +/- 0.041 mag 1.38E+14 2.86E-02 +/- 1.10E-03 Jy Broad-band 20032MASX.C.......: 20
21 K_s_14arcsec (2MASS) 11.129 +/- 0.015 mag 1.38E+14 2.36E-02 +/- 3.28E-04 Jy Broad-band 14.0 x 14.0 arcsec aperture. 20032MASX.C.......: 21
22 K (ESO/SPM) 27.2 +/- 1.81 milliJy 1.37E+14 2.72E-02 +/- 1.81E-03 Jy Broad-band 30" aperture 1995ApJ...453..616S 22
23 K_total 11.42 ... mag 1.36E+14 1.68E-02 ... Jy Broad-band 1996MNRAS.280..579H 23
24 3.6 microns (IRAC) 4.4395E+04 +/- 6.1518E+01 microJy 8.44E+13 4.44E-02 +/- 6.15E-05 Jy Broad-band 3.8" aperture 2013SSTSLC4.2....0C 24
25 3.6 microns (IRAC) 5.2300E+04 +/- 5.9354E+01 microJy 8.44E+13 5.23E-02 +/- 5.94E-05 Jy Broad-band 5.8" aperture 2013SSTSLC4.2....0C 25
26 3.6 microns (IRAC) 9.09 +/- 0.08 mag 8.44E+13 6.50E-02 +/- 4.79E-03 Jy Broad-band 2010ApJS..187..172G 26
27 4.5 microns (IRAC) 8.04 +/- 0.06 mag 6.67E+13 1.09E-01 +/- 6.04E-03 Jy Broad-band 2010ApJS..187..172G 27
28 5.5 microns (IRS) 2.27E-01 +/- 1.45E-02 Jy 5.45E+13 2.27E-01 +/- 1.45E-02 Jy Broad-band 2009ApJ...705...14D 28
29 5.8 microns (IRAC) 1.6252E+05 +/- 2.5649E+02 microJy 5.23E+13 1.63E-01 +/- 2.56E-04 Jy Broad-band 3.8" aperture 2013SSTSLC4.2....0C 29
30 5.8 microns (IRAC) 1.8285E+05 +/- 2.4695E+02 microJy 5.23E+13 1.83E-01 +/- 2.47E-04 Jy Broad-band 5.8" aperture 2013SSTSLC4.2....0C 30
31 5.8 microns (IRAC) 7.04 +/- 0.05 mag 5.23E+13 1.76E-01 +/- 8.09E-03 Jy Broad-band 2010ApJS..187..172G 31
32 6 microns (Spitzer) 15.55E-19 +/- 0.61E-19 W/cm^2^/microns 5.00E+13 1.87E-01 +/- 7.33E-03 Jy Broad-band 2007ApJ...671..124D 32
33 6 microns (ISO) 0.2205 ... Jy 5.00E+13 2.21E-01 ... Jy Broad-band 2004A&A...418..465L 33
34 PAH 6.2 (Spitzer) ... <8.03E-20 W/cm^2^ 4.84E+13 < 8.03E+07 Jy-Hz Line 2009ApJ...701..658W 34
35 6.2 microns (IRS) 54E-17 +/- 11E-17 W/m^2^ 4.84E+13 5.40E+10 +/- 1.10E+10 Jy-Hz Line 2010ApJS..187..172G 35
36 PAH 6.2 (Spitzer) 0.25E-19 +/- 0.02E-19 W/cm^2^ 4.84E+13 2.50E+10 +/- 2.00E+09 Jy-Hz Line 2007ApJ...671..124D 36
37 7.4 microns (IRS) ... <134E-17 W/m^2^ 4.05E+13 < 1.34E+11 Jy-Hz Line 2010ApJS..187..172G 37
38 7.6 microns (IRS) 103E-17 +/- 18E-17 W/m^2^ 3.94E+13 1.03E+11 +/- 1.80E+10 Jy-Hz Line 2010ApJS..187..172G 38
39 7.8 microns (IRS) ... <51E-17 W/m^2^ 3.84E+13 < 5.10E+10 Jy-Hz Line 2010ApJS..187..172G 39
40 8.0 microns (IRAC) 5.64 +/- 0.03 mag 3.81E+13 3.56E-01 +/- 9.83E-03 Jy Broad-band 2010ApJS..187..172G 40
41 8.3 microns (IRS) ... <44E-17 W/m^2^ 3.61E+13 < 4.40E+10 Jy-Hz Line 2010ApJS..187..172G 41
42 8.6 microns (IRS) ... <33E-17 W/m^2^ 3.49E+13 < 3.30E+10 Jy-Hz Line 2010ApJS..187..172G 42
43 [Ar III] (Spitzer) 0.09E-19 +/- 0.03E-19 W/cm^2^ 3.33E+13 9.00E+09 +/- 3.00E+09 Jy-Hz Line 2007ApJ...671..124D 43
44 10 microns (IRS) 2.38E-01 +/- 1.85E-02 Jy 3.00E+13 2.38E-01 +/- 1.85E-02 Jy Broad-band 2009ApJ...705...14D 44
45 [S IV] 10.51 (IRS) 2.38E-14 +/- 0.42E-14 erg/s/cm^2^ 2.85E+13 2.38E+09 +/- 4.20E+08 Jy-Hz Line SH module 2010ApJ...709.1257T 45
46 N 274.00 +/- milliJy 2.83E+13 2.74E-01 +/- ... Jy Broad-band 5.3" aperture 1995ApJ...446..561M 46
47 10.8 microns MIRLIN 161 +/- 46 milliJy 2.78E+13 1.61E-01 +/- 4.60E-02 Jy Broad-band 1.5" diam aperture 2004ApJ...605..156G 47
48 PAH 11.2 (Spitzer) 2.16E-20 +/- 0.62E-20 W/cm^2^ 2.68E+13 2.16E+07 +/- 6.20E+06 Jy-Hz Line 2009ApJ...701..658W 48
49 11.2 microns (IRS) ... <10E-17 W/m^2^ 2.68E+13 < 1.00E+10 Jy-Hz Line 2010ApJS..187..172G 49
50 11.3 microns (IRS) 104E-17 +/- 9E-17 W/m^2^ 2.65E+13 1.04E+11 +/- 9.00E+09 Jy-Hz Line 2010ApJS..187..172G 50
51 12.0 microns (IRS) 91E-17 +/- 12E-17 W/m^2^ 2.50E+13 9.10E+10 +/- 1.20E+10 Jy-Hz Line 2010ApJS..187..172G 51
52 12 microns (IRAS) 4.249E-01 +/- 8 % Jy 2.50E+13 4.25E-01 +/- 3.40E-02 Jy Broad-band IRAS quality flag = 3 1990IRASF.C...0000M 52
53 12.6 microns (IRS) 119E-17 +/- 11E-17 W/m^2^ 2.38E+13 1.19E+11 +/- 1.10E+10 Jy-Hz Line 2010ApJS..187..172G 53
54 [Ne II] (Spitzer) 0.24E-19 +/- 0.02E-19 W/cm^2^ 2.34E+13 2.40E+10 +/- 2.00E+09 Jy-Hz Line 2007ApJ...671..124D 54
55 [Ne II] 12.81 (IRS) 13.9E-14 +/- 0.53E-14 erg/s/cm^2^ 2.34E+13 1.39E+10 +/- 5.30E+08 Jy-Hz Line SH module 2010ApJ...709.1257T 55
56 [Ne II] 12.81 13.9E-21 ... W/cm^2^ 2.34E+13 1.39E+10 ... Jy-Hz Line 2011ApJS..195...17W 56
57 [Ne V] 14.32 (IRS) 2.28E-14 +/- 0.47E-14 erg/s/cm^2^ 2.09E+13 2.28E+09 +/- 4.70E+08 Jy-Hz Line SH module 2010ApJ...709.1257T 57
58 [Ne V] 14.32 2.28E-21 ... W/cm^2^ 2.09E+13 2.28E+09 ... Jy-Hz Line 2011ApJS..195...17W 58
59 14.7 microns (IRS) 8.02E-01 +/- 2.88E-02 Jy 2.04E+13 8.02E-01 +/- 2.88E-02 Jy Broad-band 2009ApJ...705...14D 59
60 15 microns (Spitzer) 9.01E-19 +/- 0.29E-19 W/cm^2^/microns 2.00E+13 6.76E-01 +/- 2.18E-02 Jy Broad-band 2007ApJ...671..124D 60
61 [Ne III] 15.56 (IRS) 7.06E-14 +/- 0.41E-14 erg/s/cm^2^ 1.93E+13 7.06E+09 +/- 4.10E+08 Jy-Hz Line SH module 2010ApJ...709.1257T 61
62 [Ne III] 15.56 7.06E-21 ... W/cm^2^ 1.93E+13 7.06E+09 ... Jy-Hz Line 2011ApJS..195...17W 62
63 [Ne III] (Spitzer) 0.18E-19 +/- 0.02E-19 W/cm^2^ 1.93E+13 1.80E+10 +/- 2.00E+09 Jy-Hz Line 2007ApJ...671..124D 63
64 17.0 microns (IRS) ... <45E-17 W/m^2^ 1.76E+13 < 4.50E+10 Jy-Hz Line 2010ApJS..187..172G 64
65 [S III] 18.71 (IRS) 3.58E-14 +/- 0.21E-14 erg/s/cm^2^ 1.60E+13 3.58E+09 +/- 2.10E+08 Jy-Hz Line SH module 2010ApJ...709.1257T 65
66 20 microns (Spitzer) 7.92E-19 +/- 0.22E-19 W/cm^2^/microns 1.50E+13 1.06E+00 +/- 2.94E-02 Jy Broad-band 2007ApJ...671..124D 66
67 20 microns (IRS) 1.07E+00 +/- 2.24E-02 Jy 1.50E+13 1.07E+00 +/- 2.24E-02 Jy Broad-band 2009ApJ...705...14D 67
68 24 microns (MIPS) 1.3385E+06 +/- 3.8243E+02 microJy 1.27E+13 1.34E+00 +/- 3.82E-04 Jy Broad-band PSF fit 2013SSTSLC4.2....0C 68
69 24 microns (MIPS) 1.3050E+06 +/- 1.2879E+02 microJy 1.27E+13 1.30E+00 +/- 1.29E-04 Jy Broad-band 14.7" aperture 2013SSTSLC4.2....0C 69
70 [Ne V] 24.32 (IRS) ... <1.44E-14 erg/s/cm^2^ 1.23E+13 < 1.44E+09 Jy-Hz Line LH module 2010ApJ...709.1257T 70
71 [Ne V] 24.32 Spitzer 0.10E-19 +/- 0.01E-19 W/cm^2^ 1.23E+13 1.00E+10 +/- 1.00E+09 Jy-Hz Line 2007ApJ...671..124D 71
72 25 microns (IRAS) 1.620E+00 +/- 6 % Jy 1.20E+13 1.62E+00 +/- 2.55E-02 Jy Broad-band IRAS quality flag = 3 1990IRASF.C...0000M 72
73 [O IV] 25.89 8.56E-21 ... W/cm^2^ 1.16E+13 8.56E+09 ... Jy-Hz Line 2011ApJS..195...17W 73
74 [O IV] 25.89 (IRS) 8.56E-14 +/- 0.49E-14 erg/s/cm^2^ 1.16E+13 8.56E+09 +/- 4.90E+08 Jy-Hz Line LH module 2010ApJ...709.1257T 74
75 [O IV] (Spitzer) 0.12E-19 +/- 0.02E-19 W/cm^2^ 1.16E+13 1.20E+10 +/- 2.00E+09 Jy-Hz Line 2007ApJ...671..124D 75
76 30 microns (Spitzer) 6.33E-19 +/- 0.10E-19 W/cm^2^/microns 9.99E+12 1.90E+00 +/- 3.00E-02 Jy Broad-band 2007ApJ...671..124D 76
77 30 microns (IRS) 1.46E+00 +/- 2.50E-02 Jy 9.99E+12 1.46E+00 +/- 2.50E-02 Jy Broad-band 2009ApJ...705...14D 77
78 [S III] 33.48 (IRS) ... <5.23E-14 erg/s/cm^2^ 8.95E+12 < 5.23E+09 Jy-Hz Line LH module 2010ApJ...709.1257T 78
79 [S III] 33.48 ... <5.23E-21 W/cm^2^ 8.95E+12 < 5.23E+09 Jy-Hz Line 2011ApJS..195...17W 79
80 [Si II] 34.28 ... <5.36E-21 W/cm^2^ 8.75E+12 < 5.36E+09 Jy-Hz Line 2011ApJS..195...17W 80
81 [Si II] 34.82 (IRS) ... <5.36E-14 erg/s/cm^2^ 8.61E+12 < 5.36E+09 Jy-Hz Line LH module 2010ApJ...709.1257T 81
82 60 microns (IRAS) 2.774E+00 +/- 7 % Jy 5.00E+12 2.77E+00 +/- 1.94E-01 Jy Broad-band IRAS quality flag = 3 1990IRASF.C...0000M 82
83 100 microns (IRAS) 2.531E+00 +/- 15 % Jy 3.00E+12 2.53E+00 +/- 3.80E-01 Jy Broad-band IRAS quality flag = 2 1990IRASF.C...0000M 83
84 5 GHz (VLA) 12.7 ... milliJy 5.00E+09 1.27E-02 ... Jy Broad-band Point source flux 2006AJ....132..546G 84
85 1.4GHz 19.0 +/- 1.4 milliJy 1.40E+09 1.90E-02 +/- 1.40E-03 Jy Broad-band High peak 1998AJ....115.1693C 85


Detailed Information for Each Entry

 No. 1
Reference Code : 2004A&A...418..465L
Freq. targeted : 2-10 keV            
Measurement    :  1.800E-14   W/m^2^               = 1.80E-14 W m^-2^
Uncertainty    :              W/m^2^               = 0.00E+00
Significance   : no uncertainty reported
Freq or Vel.   :        6     keV          (OBS   )= 1.45E+18 Hz
Frequency mode : Broad-band measurement
Coord. targeted:
Spatial mode   : Flux integrated from map
Notes          : Averaged from previously published data; NED frequency
                 assigned to mid-point of band in keV
Qualifiers     : Observed flux                           

No. 2 Reference Code : 2010ApJ...720..786L Freq. targeted : [O III] 5007 (SDSS) Measurement : 0.35E-14 erg/s/cm^2^ = 3.50E-18 W m^-2^ Uncertainty : erg/s/cm^2^ = 0.00E+00 Significance : no uncertainty reported Freq or Vel. : 5007 A (REST )= 5.99E+14 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 04 40 54.9 -08 22 22 (J2000) Spatial mode : Flux integrated from map Notes : Averaged from previously published data Qualifiers :
No. 3 Reference Code : 2006AJ....131.1163S Freq. targeted : J (2MASS/CTIO) Measurement : 13.609 mag = 5.74E-29 W m^-2^ Hz^-1^ Uncertainty : 0.074 mag = 3.91E-30 Significance : uncertainty Freq or Vel. : 1.235 microns (OBS )= 2.43E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : Profile-fit; Poor quality
No. 4 Reference Code : 2006AJ....131.1163S Freq. targeted : J (2MASS/CTIO) Measurement : 13.068 mag = 9.45E-29 W m^-2^ Hz^-1^ Uncertainty : 0.014 mag = 1.22E-30 Significance : uncertainty Freq or Vel. : 1.235 microns (OBS )= 2.43E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 4" aperture
No. 5 Reference Code : 1995ApJ...453..616S Freq. targeted : J (ESO/SPM) Measurement : 16.3 milliJy = 1.63E-28 W m^-2^ Hz^-1^ Uncertainty : 1.09 milliJy = 1.09E-29 Significance : rms uncertainty Freq or Vel. : 1.244 microns (OBS )= 2.41E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 043831.1 -082805 (B1950) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 30" aperture
No. 6 Reference Code : 20032MASX.C.......: Freq. targeted : J Measurement : 12.471 mag = 1.64E-28 W m^-2^ Hz^-1^ Uncertainty : 0.025 mag = 3.81E-30 Significance : 1 sigma uncert. Freq or Vel. : 1.25 microns (OBS )= 2.40E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 044054.95 -082222.1 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 25.8 x 17.0 arcsec integration area.
No. 7 Reference Code : 20032MASX.C.......: Freq. targeted : J Measurement : 12.190 mag = 2.12E-28 W m^-2^ Hz^-1^ Uncertainty : 0.029 mag = 5.73E-30 Significance : 1 sigma uncert. Freq or Vel. : 1.25 microns (OBS )= 2.40E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 044054.95 -082222.1 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers :
No. 8 Reference Code : 20032MASX.C.......: Freq. targeted : J_14arcsec (2MASS) Measurement : 12.704 mag = 1.32E-28 W m^-2^ Hz^-1^ Uncertainty : 0.014 mag = 1.71E-30 Significance : 1 sigma uncert. Freq or Vel. : 1.25 microns (OBS )= 2.40E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 044054.95 -082222.1 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 14.0 x 14.0 arcsec aperture.
No. 9 Reference Code : 1996MNRAS.280..579H Freq. targeted : J_total Measurement : 12.91 mag = 1.04E-28 W m^-2^ Hz^-1^ Uncertainty : mag = 0.00E+00 Significance : no uncertainty reported Freq or Vel. : 1.25 microns (OBS )= 2.40E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data; Standard Caltech JHKL filters assumed Qualifiers :
No. 10 Reference Code : 1995ApJ...453..616S Freq. targeted : H (ESO/SPM) Measurement : 22.8 milliJy = 2.28E-28 W m^-2^ Hz^-1^ Uncertainty : 1.52 milliJy = 1.52E-29 Significance : rms uncertainty Freq or Vel. : 1.634 microns (OBS )= 1.84E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 043831.1 -082805 (B1950) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 30" aperture
No. 11 Reference Code : 20032MASX.C.......: Freq. targeted : H Measurement : 11.656 mag = 2.23E-28 W m^-2^ Hz^-1^ Uncertainty : 0.031 mag = 6.45E-30 Significance : 1 sigma uncert. Freq or Vel. : 1.65 microns (OBS )= 1.82E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 044054.95 -082222.1 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 25.8 x 17.0 arcsec integration area.
No. 12 Reference Code : 20032MASX.C.......: Freq. targeted : H Measurement : 11.377 mag = 2.88E-28 W m^-2^ Hz^-1^ Uncertainty : 0.034 mag = 9.16E-30 Significance : 1 sigma uncert. Freq or Vel. : 1.65 microns (OBS )= 1.82E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 044054.95 -082222.1 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers :
No. 13 Reference Code : 20032MASX.C.......: Freq. targeted : H_14arcsec (2MASS) Measurement : 11.849 mag = 1.87E-28 W m^-2^ Hz^-1^ Uncertainty : 0.015 mag = 2.59E-30 Significance : 1 sigma uncert. Freq or Vel. : 1.65 microns (OBS )= 1.82E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 044054.95 -082222.1 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 14.0 x 14.0 arcsec aperture.
No. 14 Reference Code : 1996MNRAS.280..579H Freq. targeted : H_total Measurement : 12.04 mag = 1.50E-28 W m^-2^ Hz^-1^ Uncertainty : mag = 0.00E+00 Significance : no uncertainty reported Freq or Vel. : 1.65 microns (OBS )= 1.82E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data; Standard Caltech JHKL filters assumed Qualifiers :
No. 15 Reference Code : 2006AJ....131.1163S Freq. targeted : H (2MASS/CTIO) Measurement : 12.134 mag = 1.43E-28 W m^-2^ Hz^-1^ Uncertainty : 0.009 mag = 1.19E-30 Significance : uncertainty Freq or Vel. : 1.662 microns (OBS )= 1.80E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 4" aperture
No. 16 Reference Code : 2006AJ....131.1163S Freq. targeted : H (2MASS/CTIO) Measurement : 12.582 mag = 9.50E-29 W m^-2^ Hz^-1^ Uncertainty : 0.083 mag = 7.26E-30 Significance : uncertainty Freq or Vel. : 1.662 microns (OBS )= 1.80E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : Profile-fit
No. 17 Reference Code : 2006AJ....131.1163S Freq. targeted : K_s (2MASS/CTIO) Measurement : 11.502 mag = 1.67E-28 W m^-2^ Hz^-1^ Uncertainty : 0.039 mag = 6.01E-30 Significance : uncertainty Freq or Vel. : 2.159 microns (OBS )= 1.39E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : Profile-fit
No. 18 Reference Code : 2006AJ....131.1163S Freq. targeted : K_s (2MASS/CTIO) Measurement : 11.325 mag = 1.97E-28 W m^-2^ Hz^-1^ Uncertainty : 0.014 mag = 2.54E-30 Significance : uncertainty Freq or Vel. : 2.159 microns (OBS )= 1.39E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 4" aperture
No. 19 Reference Code : 20032MASX.C.......: Freq. targeted : K_s Measurement : 11.017 mag = 2.61E-28 W m^-2^ Hz^-1^ Uncertainty : 0.040 mag = 9.81E-30 Significance : 1 sigma uncert. Freq or Vel. : 2.17 microns (OBS )= 1.38E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 044054.95 -082222.1 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 25.8 x 17.0 arcsec integration area.
No. 20 Reference Code : 20032MASX.C.......: Freq. targeted : K_s Measurement : 10.920 mag = 2.86E-28 W m^-2^ Hz^-1^ Uncertainty : 0.041 mag = 1.10E-29 Significance : 1 sigma uncert. Freq or Vel. : 2.17 microns (OBS )= 1.38E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 044054.95 -082222.1 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers :
No. 21 Reference Code : 20032MASX.C.......: Freq. targeted : K_s_14arcsec (2MASS) Measurement : 11.129 mag = 2.36E-28 W m^-2^ Hz^-1^ Uncertainty : 0.015 mag = 3.28E-30 Significance : 1 sigma uncert. Freq or Vel. : 2.17 microns (OBS )= 1.38E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 044054.95 -082222.1 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 14.0 x 14.0 arcsec aperture.
No. 22 Reference Code : 1995ApJ...453..616S Freq. targeted : K (ESO/SPM) Measurement : 27.2 milliJy = 2.72E-28 W m^-2^ Hz^-1^ Uncertainty : 1.81 milliJy = 1.81E-29 Significance : rms uncertainty Freq or Vel. : 2.194 microns (OBS )= 1.37E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: 043831.1 -082805 (B1950) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 30" aperture
No. 23 Reference Code : 1996MNRAS.280..579H Freq. targeted : K_total Measurement : 11.42 mag = 1.68E-28 W m^-2^ Hz^-1^ Uncertainty : mag = 0.00E+00 Significance : no uncertainty reported Freq or Vel. : 2.2 microns (OBS )= 1.36E+14 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data; Standard Caltech JHKL filters assumed Qualifiers :
No. 24 Reference Code : 2013SSTSLC4.2....0C Freq. targeted : 3.6 microns (IRAC) Measurement : 4.4395E+04 microJy = 4.44E-28 W m^-2^ Hz^-1^ Uncertainty : 6.1518E+01 microJy = 6.15E-31 Significance : uncertainty Freq or Vel. : 3.55 microns (OBS )= 8.44E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 3.8" aperture
No. 25 Reference Code : 2013SSTSLC4.2....0C Freq. targeted : 3.6 microns (IRAC) Measurement : 5.2300E+04 microJy = 5.23E-28 W m^-2^ Hz^-1^ Uncertainty : 5.9354E+01 microJy = 5.94E-31 Significance : uncertainty Freq or Vel. : 3.55 microns (OBS )= 8.44E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 5.8" aperture
No. 26 Reference Code : 2010ApJS..187..172G Freq. targeted : 3.6 microns (IRAC) Measurement : 9.09 mag = 6.50E-28 W m^-2^ Hz^-1^ Uncertainty : 0.08 mag = 4.79E-29 Significance : uncertainty Freq or Vel. : 3.550 microns (OBS )= 8.44E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: 04 40 54.96 -08 22 21.9 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers :
No. 27 Reference Code : 2010ApJS..187..172G Freq. targeted : 4.5 microns (IRAC) Measurement : 8.04 mag = 1.09E-27 W m^-2^ Hz^-1^ Uncertainty : 0.06 mag = 6.04E-29 Significance : uncertainty Freq or Vel. : 4.493 microns (OBS )= 6.67E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: 04 40 54.96 -08 22 21.9 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers :
No. 28 Reference Code : 2009ApJ...705...14D Freq. targeted : 5.5 microns (IRS) Measurement : 2.27E-01 Jy = 2.27E-27 W m^-2^ Hz^-1^ Uncertainty : 1.45E-02 Jy = 1.45E-28 Significance : uncertainty Freq or Vel. : 5.5 microns (OBS )= 5.45E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From reprocessed raw data Qualifiers :
No. 29 Reference Code : 2013SSTSLC4.2....0C Freq. targeted : 5.8 microns (IRAC) Measurement : 1.6252E+05 microJy = 1.63E-27 W m^-2^ Hz^-1^ Uncertainty : 2.5649E+02 microJy = 2.56E-30 Significance : uncertainty Freq or Vel. : 5.731 microns (OBS )= 5.23E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 3.8" aperture
No. 30 Reference Code : 2013SSTSLC4.2....0C Freq. targeted : 5.8 microns (IRAC) Measurement : 1.8285E+05 microJy = 1.83E-27 W m^-2^ Hz^-1^ Uncertainty : 2.4695E+02 microJy = 2.47E-30 Significance : uncertainty Freq or Vel. : 5.731 microns (OBS )= 5.23E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 5.8" aperture
No. 31 Reference Code : 2010ApJS..187..172G Freq. targeted : 5.8 microns (IRAC) Measurement : 7.04 mag = 1.76E-27 W m^-2^ Hz^-1^ Uncertainty : 0.05 mag = 8.09E-29 Significance : uncertainty Freq or Vel. : 5.731 microns (OBS )= 5.23E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: 04 40 54.96 -08 22 21.9 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers :
No. 32 Reference Code : 2007ApJ...671..124D Freq. targeted : 6 microns (Spitzer) Measurement : 15.55E-19 W/cm^2^/microns = 1.87E-27 W m^-2^ Hz^-1^ Uncertainty : 0.61E-19 W/cm^2^/microns = 7.33E-29 Significance : uncertainty Freq or Vel. : 6.00 microns (OBS )= 5.00E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 33 Reference Code : 2004A&A...418..465L Freq. targeted : 6 microns (ISO) Measurement : 0.2205 Jy = 2.20E-27 W m^-2^ Hz^-1^ Uncertainty : Jy = 0.00E+00 Significance : no uncertainty reported Freq or Vel. : 6 microns (REST )= 5.00E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From reprocessed raw data Qualifiers :
No. 34 Reference Code : 2009ApJ...701..658W Freq. targeted : PAH 6.2 (Spitzer) Measurement : <8.03E-20 W/cm^2^ < 8.03E-19 W m^-2^ Uncertainty : Significance : no uncertainty reported Freq or Vel. : 6.2 microns (REST )= 4.84E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 04 40 54.9 -08 22 22 (J2000) Spatial mode : Flux in fixed aperture Notes : From reprocessed raw data Qualifiers :
No. 35 Reference Code : 2010ApJS..187..172G Freq. targeted : 6.2 microns (IRS) Measurement : 54E-17 W/m^2^ = 5.40E-16 W m^-2^ Uncertainty : 11E-17 W/m^2^ = 1.10E-16 Significance : 1 sigma Freq or Vel. : 6.2 microns (REST )= 4.84E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 04 40 54.96 -08 22 21.9 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 36 Reference Code : 2007ApJ...671..124D Freq. targeted : PAH 6.2 (Spitzer) Measurement : 0.25E-19 W/cm^2^ = 2.50E-16 W m^-2^ Uncertainty : 0.02E-19 W/cm^2^ = 2.00E-17 Significance : uncertainty Freq or Vel. : 6.2 microns (REST )= 4.84E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 37 Reference Code : 2010ApJS..187..172G Freq. targeted : 7.4 microns (IRS) Measurement : <134E-17 W/m^2^ < 1.34E-15 W m^-2^ Uncertainty : Significance : 3 sigma Freq or Vel. : 7.4 microns (REST )= 4.05E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 04 40 54.96 -08 22 21.9 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 38 Reference Code : 2010ApJS..187..172G Freq. targeted : 7.6 microns (IRS) Measurement : 103E-17 W/m^2^ = 1.03E-15 W m^-2^ Uncertainty : 18E-17 W/m^2^ = 1.80E-16 Significance : 1 sigma Freq or Vel. : 7.6 microns (REST )= 3.94E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 04 40 54.96 -08 22 21.9 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 39 Reference Code : 2010ApJS..187..172G Freq. targeted : 7.8 microns (IRS) Measurement : <51E-17 W/m^2^ < 5.10E-16 W m^-2^ Uncertainty : Significance : 3 sigma Freq or Vel. : 7.8 microns (REST )= 3.84E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 04 40 54.96 -08 22 21.9 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 40 Reference Code : 2010ApJS..187..172G Freq. targeted : 8.0 microns (IRAC) Measurement : 5.64 mag = 3.56E-27 W m^-2^ Hz^-1^ Uncertainty : 0.03 mag = 9.83E-29 Significance : uncertainty Freq or Vel. : 7.872 microns (OBS )= 3.81E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: 04 40 54.96 -08 22 21.9 (J2000) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers :
No. 41 Reference Code : 2010ApJS..187..172G Freq. targeted : 8.3 microns (IRS) Measurement : <44E-17 W/m^2^ < 4.40E-16 W m^-2^ Uncertainty : Significance : 3 sigma Freq or Vel. : 8.3 microns (REST )= 3.61E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 04 40 54.96 -08 22 21.9 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 42 Reference Code : 2010ApJS..187..172G Freq. targeted : 8.6 microns (IRS) Measurement : <33E-17 W/m^2^ < 3.30E-16 W m^-2^ Uncertainty : Significance : 3 sigma Freq or Vel. : 8.6 microns (REST )= 3.49E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 04 40 54.96 -08 22 21.9 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 43 Reference Code : 2007ApJ...671..124D Freq. targeted : [Ar III] (Spitzer) Measurement : 0.09E-19 W/cm^2^ = 9.00E-17 W m^-2^ Uncertainty : 0.03E-19 W/cm^2^ = 3.00E-17 Significance : uncertainty Freq or Vel. : 8.99 microns (REST )= 3.33E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 44 Reference Code : 2009ApJ...705...14D Freq. targeted : 10 microns (IRS) Measurement : 2.38E-01 Jy = 2.38E-27 W m^-2^ Hz^-1^ Uncertainty : 1.85E-02 Jy = 1.85E-28 Significance : uncertainty Freq or Vel. : 10 microns (OBS )= 3.00E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From reprocessed raw data Qualifiers :
No. 45 Reference Code : 2010ApJ...709.1257T Freq. targeted : [S IV] 10.51 (IRS) Measurement : 2.38E-14 erg/s/cm^2^ = 2.38E-17 W m^-2^ Uncertainty : 0.42E-14 erg/s/cm^2^ = 4.20E-18 Significance : uncertainty Freq or Vel. : 10.51 microns (REST )= 2.85E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 04 40 54.9 -08 22 22 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : SH module
No. 46 Reference Code : 1995ApJ...446..561M Freq. targeted : N Measurement : 274.00 milliJy = 2.74E-27 W m^-2^ Hz^-1^ Uncertainty : milliJy = 0.00E+00 Significance : times noise Freq or Vel. : 10.6 microns (OBS )= 2.83E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 5.3" aperture
No. 47 Reference Code : 2004ApJ...605..156G Freq. targeted : 10.8 microns MIRLIN Measurement : 161 milliJy = 1.61E-27 W m^-2^ Hz^-1^ Uncertainty : 46 milliJy = 4.60E-28 Significance : statistical error Freq or Vel. : 10.8 microns (OBS )= 2.78E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 1.5" diam aperture
No. 48 Reference Code : 2009ApJ...701..658W Freq. targeted : PAH 11.2 (Spitzer) Measurement : 2.16E-20 W/cm^2^ = 2.16E-19 W m^-2^ Uncertainty : 0.62E-20 W/cm^2^ = 6.20E-20 Significance : uncertainty Freq or Vel. : 11.2 microns (REST )= 2.68E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 04 40 54.9 -08 22 22 (J2000) Spatial mode : Flux in fixed aperture Notes : From reprocessed raw data Qualifiers :
No. 49 Reference Code : 2010ApJS..187..172G Freq. targeted : 11.2 microns (IRS) Measurement : <10E-17 W/m^2^ < 1.00E-16 W m^-2^ Uncertainty : Significance : 3 sigma Freq or Vel. : 11.2 microns (REST )= 2.68E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 04 40 54.96 -08 22 21.9 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 50 Reference Code : 2010ApJS..187..172G Freq. targeted : 11.3 microns (IRS) Measurement : 104E-17 W/m^2^ = 1.04E-15 W m^-2^ Uncertainty : 9E-17 W/m^2^ = 9.00E-17 Significance : 1 sigma Freq or Vel. : 11.3 microns (REST )= 2.65E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 04 40 54.96 -08 22 21.9 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 51 Reference Code : 2010ApJS..187..172G Freq. targeted : 12.0 microns (IRS) Measurement : 91E-17 W/m^2^ = 9.10E-16 W m^-2^ Uncertainty : 12E-17 W/m^2^ = 1.20E-16 Significance : 1 sigma Freq or Vel. : 12.0 microns (REST )= 2.50E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 04 40 54.96 -08 22 21.9 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 52 Reference Code : 1990IRASF.C...0000M Freq. targeted : 12 microns (IRAS) Measurement : 4.249E-01 Jy = 4.25E-27 W m^-2^ Hz^-1^ Uncertainty : 8 % Jy = 3.40E-28 Significance : uncertainty Freq or Vel. : 12 microns (OBS )= 2.50E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: 043831.1 -082805 (B1950) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : IRAS quality flag = 3
No. 53 Reference Code : 2010ApJS..187..172G Freq. targeted : 12.6 microns (IRS) Measurement : 119E-17 W/m^2^ = 1.19E-15 W m^-2^ Uncertainty : 11E-17 W/m^2^ = 1.10E-16 Significance : 1 sigma Freq or Vel. : 12.6 microns (REST )= 2.38E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 04 40 54.96 -08 22 21.9 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 54 Reference Code : 2007ApJ...671..124D Freq. targeted : [Ne II] (Spitzer) Measurement : 0.24E-19 W/cm^2^ = 2.40E-16 W m^-2^ Uncertainty : 0.02E-19 W/cm^2^ = 2.00E-17 Significance : uncertainty Freq or Vel. : 12.81 microns (REST )= 2.34E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 55 Reference Code : 2010ApJ...709.1257T Freq. targeted : [Ne II] 12.81 (IRS) Measurement : 13.9E-14 erg/s/cm^2^ = 1.39E-16 W m^-2^ Uncertainty : 0.53E-14 erg/s/cm^2^ = 5.30E-18 Significance : uncertainty Freq or Vel. : 12.81 microns (REST )= 2.34E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 04 40 54.9 -08 22 22 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : SH module
No. 56 Reference Code : 2011ApJS..195...17W Freq. targeted : [Ne II] 12.81 Measurement : 13.9E-21 W/cm^2^ = 1.39E-16 W m^-2^ Uncertainty : W/cm^2^ = 0.00E+00 Significance : no uncertainty reported Freq or Vel. : 12.81 microns (REST )= 2.34E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Not reported in paper Notes : Averaged from previously published data Qualifiers :
No. 57 Reference Code : 2010ApJ...709.1257T Freq. targeted : [Ne V] 14.32 (IRS) Measurement : 2.28E-14 erg/s/cm^2^ = 2.28E-17 W m^-2^ Uncertainty : 0.47E-14 erg/s/cm^2^ = 4.70E-18 Significance : uncertainty Freq or Vel. : 14.32 microns (REST )= 2.09E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 04 40 54.9 -08 22 22 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : SH module
No. 58 Reference Code : 2011ApJS..195...17W Freq. targeted : [Ne V] 14.32 Measurement : 2.28E-21 W/cm^2^ = 2.28E-17 W m^-2^ Uncertainty : W/cm^2^ = 0.00E+00 Significance : no uncertainty reported Freq or Vel. : 14.32 microns (REST )= 2.09E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Not reported in paper Notes : Averaged from previously published data Qualifiers :
No. 59 Reference Code : 2009ApJ...705...14D Freq. targeted : 14.7 microns (IRS) Measurement : 8.02E-01 Jy = 8.02E-27 W m^-2^ Hz^-1^ Uncertainty : 2.88E-02 Jy = 2.88E-28 Significance : uncertainty Freq or Vel. : 14.7 microns (OBS )= 2.04E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From reprocessed raw data Qualifiers :
No. 60 Reference Code : 2007ApJ...671..124D Freq. targeted : 15 microns (Spitzer) Measurement : 9.01E-19 W/cm^2^/microns = 6.76E-27 W m^-2^ Hz^-1^ Uncertainty : 0.29E-19 W/cm^2^/microns = 2.18E-28 Significance : uncertainty Freq or Vel. : 15.00 microns (OBS )= 2.00E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 61 Reference Code : 2010ApJ...709.1257T Freq. targeted : [Ne III] 15.56 (IRS) Measurement : 7.06E-14 erg/s/cm^2^ = 7.06E-17 W m^-2^ Uncertainty : 0.41E-14 erg/s/cm^2^ = 4.10E-18 Significance : uncertainty Freq or Vel. : 15.56 microns (REST )= 1.93E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 04 40 54.9 -08 22 22 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : SH module
No. 62 Reference Code : 2011ApJS..195...17W Freq. targeted : [Ne III] 15.56 Measurement : 7.06E-21 W/cm^2^ = 7.06E-17 W m^-2^ Uncertainty : W/cm^2^ = 0.00E+00 Significance : no uncertainty reported Freq or Vel. : 15.56 microns (REST )= 1.93E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Not reported in paper Notes : Averaged from previously published data Qualifiers :
No. 63 Reference Code : 2007ApJ...671..124D Freq. targeted : [Ne III] (Spitzer) Measurement : 0.18E-19 W/cm^2^ = 1.80E-16 W m^-2^ Uncertainty : 0.02E-19 W/cm^2^ = 2.00E-17 Significance : uncertainty Freq or Vel. : 15.56 microns (REST )= 1.93E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 64 Reference Code : 2010ApJS..187..172G Freq. targeted : 17.0 microns (IRS) Measurement : <45E-17 W/m^2^ < 4.50E-16 W m^-2^ Uncertainty : Significance : 3 sigma Freq or Vel. : 17.0 microns (REST )= 1.76E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 04 40 54.96 -08 22 21.9 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 65 Reference Code : 2010ApJ...709.1257T Freq. targeted : [S III] 18.71 (IRS) Measurement : 3.58E-14 erg/s/cm^2^ = 3.58E-17 W m^-2^ Uncertainty : 0.21E-14 erg/s/cm^2^ = 2.10E-18 Significance : uncertainty Freq or Vel. : 18.71 microns (REST )= 1.60E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 04 40 54.9 -08 22 22 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : SH module
No. 66 Reference Code : 2007ApJ...671..124D Freq. targeted : 20 microns (Spitzer) Measurement : 7.92E-19 W/cm^2^/microns = 1.06E-26 W m^-2^ Hz^-1^ Uncertainty : 0.22E-19 W/cm^2^/microns = 2.94E-28 Significance : uncertainty Freq or Vel. : 20.00 microns (OBS )= 1.50E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 67 Reference Code : 2009ApJ...705...14D Freq. targeted : 20 microns (IRS) Measurement : 1.07E+00 Jy = 1.07E-26 W m^-2^ Hz^-1^ Uncertainty : 2.24E-02 Jy = 2.24E-28 Significance : uncertainty Freq or Vel. : 20 microns (OBS )= 1.50E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From reprocessed raw data Qualifiers :
No. 68 Reference Code : 2013SSTSLC4.2....0C Freq. targeted : 24 microns (MIPS) Measurement : 1.3385E+06 microJy = 1.34E-26 W m^-2^ Hz^-1^ Uncertainty : 3.8243E+02 microJy = 3.82E-30 Significance : uncertainty Freq or Vel. : 23.68 microns (OBS )= 1.27E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Modelled datum Notes : From new raw data Qualifiers : PSF fit
No. 69 Reference Code : 2013SSTSLC4.2....0C Freq. targeted : 24 microns (MIPS) Measurement : 1.3050E+06 microJy = 1.30E-26 W m^-2^ Hz^-1^ Uncertainty : 1.2879E+02 microJy = 1.29E-30 Significance : uncertainty Freq or Vel. : 23.68 microns (OBS )= 1.27E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : 14.7" aperture
No. 70 Reference Code : 2010ApJ...709.1257T Freq. targeted : [Ne V] 24.32 (IRS) Measurement : <1.44E-14 erg/s/cm^2^ < 1.44E-17 W m^-2^ Uncertainty : Significance : uncertainty Freq or Vel. : 24.32 microns (REST )= 1.23E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 04 40 54.9 -08 22 22 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : LH module
No. 71 Reference Code : 2007ApJ...671..124D Freq. targeted : [Ne V] 24.32 Spitzer Measurement : 0.10E-19 W/cm^2^ = 1.00E-16 W m^-2^ Uncertainty : 0.01E-19 W/cm^2^ = 1.00E-17 Significance : uncertainty Freq or Vel. : 24.32 microns (REST )= 1.23E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 72 Reference Code : 1990IRASF.C...0000M Freq. targeted : 25 microns (IRAS) Measurement : 1.620E+00 Jy = 1.62E-26 W m^-2^ Hz^-1^ Uncertainty : 6 % Jy = 2.55E-28 Significance : uncertainty Freq or Vel. : 25 microns (OBS )= 1.20E+13 Hz Frequency mode : Broad-band measurement Coord. targeted: 043831.1 -082805 (B1950) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : IRAS quality flag = 3
No. 73 Reference Code : 2011ApJS..195...17W Freq. targeted : [O IV] 25.89 Measurement : 8.56E-21 W/cm^2^ = 8.56E-17 W m^-2^ Uncertainty : W/cm^2^ = 0.00E+00 Significance : no uncertainty reported Freq or Vel. : 25.89 microns (REST )= 1.16E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Not reported in paper Notes : Averaged from previously published data Qualifiers :
No. 74 Reference Code : 2010ApJ...709.1257T Freq. targeted : [O IV] 25.89 (IRS) Measurement : 8.56E-14 erg/s/cm^2^ = 8.56E-17 W m^-2^ Uncertainty : 0.49E-14 erg/s/cm^2^ = 4.90E-18 Significance : uncertainty Freq or Vel. : 25.89 microns (REST )= 1.16E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 04 40 54.9 -08 22 22 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : LH module
No. 75 Reference Code : 2007ApJ...671..124D Freq. targeted : [O IV] (Spitzer) Measurement : 0.12E-19 W/cm^2^ = 1.20E-16 W m^-2^ Uncertainty : 0.02E-19 W/cm^2^ = 2.00E-17 Significance : uncertainty Freq or Vel. : 25.89 microns (REST )= 1.16E+13 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 76 Reference Code : 2007ApJ...671..124D Freq. targeted : 30 microns (Spitzer) Measurement : 6.33E-19 W/cm^2^/microns = 1.90E-26 W m^-2^ Hz^-1^ Uncertainty : 0.10E-19 W/cm^2^/microns = 3.00E-28 Significance : uncertainty Freq or Vel. : 30.00 microns (OBS )= 9.99E+12 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers :
No. 77 Reference Code : 2009ApJ...705...14D Freq. targeted : 30 microns (IRS) Measurement : 1.46E+00 Jy = 1.46E-26 W m^-2^ Hz^-1^ Uncertainty : 2.50E-02 Jy = 2.50E-28 Significance : uncertainty Freq or Vel. : 30 microns (OBS )= 9.99E+12 Hz Frequency mode : Broad-band measurement Coord. targeted: Spatial mode : Flux integrated from map Notes : From reprocessed raw data Qualifiers :
No. 78 Reference Code : 2010ApJ...709.1257T Freq. targeted : [S III] 33.48 (IRS) Measurement : <5.23E-14 erg/s/cm^2^ < 5.23E-17 W m^-2^ Uncertainty : Significance : uncertainty Freq or Vel. : 33.48 microns (REST )= 8.95E+12 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 04 40 54.9 -08 22 22 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : LH module
No. 79 Reference Code : 2011ApJS..195...17W Freq. targeted : [S III] 33.48 Measurement : <5.23E-21 W/cm^2^ < 5.23E-17 W m^-2^ Uncertainty : Significance : no uncertainty reported Freq or Vel. : 33.48 microns (REST )= 8.95E+12 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Not reported in paper Notes : Averaged from previously published data Qualifiers :
No. 80 Reference Code : 2011ApJS..195...17W Freq. targeted : [Si II] 34.28 Measurement : <5.36E-21 W/cm^2^ < 5.36E-17 W m^-2^ Uncertainty : Significance : no uncertainty reported Freq or Vel. : 34.28 microns (REST )= 8.75E+12 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: Spatial mode : Not reported in paper Notes : Averaged from previously published data Qualifiers :
No. 81 Reference Code : 2010ApJ...709.1257T Freq. targeted : [Si II] 34.82 (IRS) Measurement : <5.36E-14 erg/s/cm^2^ < 5.36E-17 W m^-2^ Uncertainty : Significance : uncertainty Freq or Vel. : 34.82 microns (REST )= 8.61E+12 Hz Frequency mode : Line measurement; flux integrated over line; lines measured in emission Coord. targeted: 04 40 54.9 -08 22 22 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : LH module
No. 82 Reference Code : 1990IRASF.C...0000M Freq. targeted : 60 microns (IRAS) Measurement : 2.774E+00 Jy = 2.77E-26 W m^-2^ Hz^-1^ Uncertainty : 7 % Jy = 1.94E-27 Significance : uncertainty Freq or Vel. : 60 microns (OBS )= 5.00E+12 Hz Frequency mode : Broad-band measurement Coord. targeted: 043831.1 -082805 (B1950) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : IRAS quality flag = 3
No. 83 Reference Code : 1990IRASF.C...0000M Freq. targeted : 100 microns (IRAS) Measurement : 2.531E+00 Jy = 2.53E-26 W m^-2^ Hz^-1^ Uncertainty : 15 % Jy = 3.80E-27 Significance : uncertainty Freq or Vel. : 100 microns (OBS )= 3.00E+12 Hz Frequency mode : Broad-band measurement Coord. targeted: 043831.1 -082805 (B1950) Spatial mode : Flux in fixed aperture Notes : From new raw data Qualifiers : IRAS quality flag = 2
No. 84 Reference Code : 2006AJ....132..546G Freq. targeted : 5 GHz (VLA) Measurement : 12.7 milliJy = 1.27E-28 W m^-2^ Hz^-1^ Uncertainty : milliJy = 0.00E+00 Significance : no uncertainty reported Freq or Vel. : 5 GHz (OBS )= 5.00E+09 Hz Frequency mode : Broad-band measurement Coord. targeted: 04 40 54.971 -08 22 22.03 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : Point source flux
No. 85 Reference Code : 1998AJ....115.1693C Freq. targeted : 1.4GHz Measurement : 19.0 milliJy = 1.90E-28 W m^-2^ Hz^-1^ Uncertainty : 1.4 milliJy = 1.40E-29 Significance : uncertainty Freq or Vel. : 1.40 GHz (OBS )= 1.40E+09 Hz Frequency mode : Broad-band measurement Coord. targeted: 04 40 54.33 -08 22 20.7 (J2000) Spatial mode : Flux integrated from map Notes : From new raw data Qualifiers : High peak

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