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Article Contents

ABSTRACT

1.INTRODUCTION

2.BASIC PRINCIPLES

3.ULTRAVIOLET EMISSION-LINE DIAGNOSTICS

4.OPTICAL EMISSION-LINE DIAGNOSTICS

5.NEAR-INFRARED EMISSION-LINE DIAGNOSTICS

6.MID-TO-FAR INFRARED EMISSION-LINE DIAGNOSTICS

7.COMPLICATIONS

7.1.Contribution from Shocks

7.2.Aperture Effects

7.3.Morphological Biases

7.4.Metallicity Effects

8.SUMMARY

REFERENCES